EN35QX512A-104YIP(2SC)

The EN35QX512A-104YIP(2SC) is a 512 M-bit serial SPI NOR flash memory device designed for industrial embedded storage. Based on a serial SPI architecture, it provides uniform 4-Kbyte sectors, flexible Single/Dual/Quad I/O modes and high read performance for code and data storage in space-constrained surface-mount applications.

Built for embedded and industrial use, the device combines fast read access, hardware and software write-protection, and long data retention to support firmware storage, in-field updates and secure data segments across a broad operating temperature range.

Key Features

• Memory & Capacity 512 M-bit (65,536 KByte) serial flash organized as 64M × 8 with 256-byte programmable pages and 4-Kbyte uniform sectors.
• Interface & Performance SPI serial interface with Standard, Dual and Quad SPI support; Fast Read up to 104 MHz for Single/Dual/Quad I/O and conditional 133 MHz Quad I/O operation.
• Program / Erase Performance Page program time typically 0.5 ms; sector erase typically 40 ms, half-block and block erase times listed at 200 ms and 300 ms respectively, and full chip erase around 120 s.
• Power Single power-supply operation with full voltage range 2.7–3.6 V and low typical currents (typical active current ~14 mA, typical power-down current ~2 μA).
• Reliability & Endurance Minimum 100K program/erase cycles per sector and typical data retention time of 20 years.
• Security & Protection Software and hardware write-protect features, lockable 3 × 512‑byte OTP security sector, and support for Serial Flash Discoverable Parameters (SFDP) and unique ID read.
• Addressing & Compatibility Supports 3-byte and 4-byte address modes for extended addressing and in-field capacity scaling.
• Package & Temperature Surface-mount 8-contact WSON (8 × 6 mm) package option with industrial temperature grade (−40 °C to 85 °C).

Typical Applications

• Embedded Firmware Storage Non-volatile storage for boot code and firmware images with sector-level protection for safe updates and patching.
• Industrial Control Systems Reliable program and data storage across −40 °C to 85 °C for PLCs, HMI modules and other industrial electronics.
• IoT and Edge Devices Compact surface-mount package and Quad SPI support provide high-density code storage and fast read performance for connected devices.
• Consumer and Professional Electronics Storage of configuration data, calibration tables and firmware in space-limited designs where low power and fast reads are required.

Unique Advantages

• High-density non-volatile storage: 512 M-bit capacity in a small 8‑lead WSON package reduces board area while providing ample space for firmware and data.
• Flexible I/O modes: Standard, Dual and Quad SPI compatibility enables designers to trade off pin usage and throughput to meet system requirements.
• Fast read performance: Up to 104 MHz Fast Read for responsive code execution and data retrieval; conditional 133 MHz Quad option for higher throughput.
• Robust program/erase characteristics: Typical 0.5 ms page program and 40 ms sector erase times combined with ≥100K endurance cycles support frequent updates and long-term use.
• Integrated protection and security: Hardware and software write protection plus lockable OTP region let systems protect critical boot or configuration data.
• Industrial-grade operation: Specified for −40 °C to 85 °C and available in surface-mount WSON packaging for reliable deployment in rugged environments.

Why Choose EN35QX512A-104YIP(2SC)?

The EN35QX512A-104YIP(2SC) positions itself as a high-capacity, industrial-grade serial flash solution that balances density, performance and protection. Its SPI-based architecture with Single/Dual/Quad I/O, uniform sectoring and fast read capability make it well suited for embedded systems that require reliable firmware storage and secure, in-field updates.

Designers building industrial controllers, IoT devices, or compact electronics benefit from the device’s endurance, long data retention and low-power standby behavior, enabling scalable and robust product lifecycles in challenging environments.

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