SN74LVT18512DGG

The SN74LVT18512DGG is a 3.3V ABT scan test device from Texas Instruments, an 18-bit universal bus transceiver with on-chip IEEE 1149.1 boundary-scan test logic. It belongs to the SCOPE and Widebus families and can operate as two 9-bit transceivers or one 18-bit transceiver, combining D-type latches and flip-flops for transparent, latched, or clocked data flow. The built-in test circuitry performs boundary scan, pattern generation, and self-test without disturbing normal bus operation. It ships in a 64-pin TSSOP on 0.5mm pitch.

Key Features

• 18-bit universal bus transceiver - configurable as two independent 9-bit transceivers or one 18-bit transceiver.
• Transparent, latched, or clocked - the universal bus transceiver cells support all three data-flow modes under control-pin selection.
• IEEE 1149.1 boundary scan - a 4-wire JTAG TAP with an 8-bit instruction register, 48-bit boundary-scan register, and device ID register.
• SCOPE test instructions - parallel-signature analysis, pseudo-random pattern generation, sample, and self-test in addition to the mandatory 1149.1 instructions.
• 3.3V with 5V-tolerant I/O - a 2.7V to 3.6V supply, operation from -40°C to 85°C, and inputs and outputs that tolerate 5V signals.
• Fast clocking - a test clock up to 50 MHz and a data-path clock up to 100 MHz at 3.3V.

Typical Applications

• Testable backplane interfaces - wide 18-bit bus links that must support in-system boundary-scan test.
• Mixed 3.3V and 5V systems - bridging a 3.3V controller to 5V bus signals thanks to tolerant I/O.
• Built-in self-test designs - boards using PSA and PRPG for at-speed structural test.
• Widebus data paths - wide memory and processor buses that benefit from an 18-bit device in a single package.

Unique Advantages

• Test and transceiver in one - combining a wide bus transceiver with a full SCOPE test controller removes the need for separate test buffers.
• Flexible width - the two-9-bit or one-18-bit configuration adapts the same part to different bus layouts.
• Voltage bridging - 5V-tolerant I/O on a 3.3V core eases the transition between logic generations on one board.
• Full scan register set - a 48-bit boundary-scan register and a 32-bit device identification register give thorough test coverage of the wide interface.

Why Choose SN74LVT18512DGG?

The SN74LVT18512DGG is a strong choice when a wide 3.3V bus interface also has to be fully testable through JTAG. Its 18-bit universal bus transceiver, embedded SCOPE test logic, 5V-tolerant I/O, and fast 50 MHz test clock let one device carry data and support structural test at once, simplifying boards that must meet boundary-scan requirements. Operating as either two 9-bit transceivers or one 18-bit path, with a 100 MHz data-path clock, it adapts to varied bus layouts without a separate part.

Contact us for pricing, availability, and lead time on the SN74LVT18512DGG, and tell us your bus width and voltage so we can confirm fit.