MTFC32GAZAQDW-AAT

IC FLASH 32GBIT PAR 100LBGA
Part Description

IC FLASH 32GBIT PAR 100LBGA

Quantity 75 Available (as of May 5, 2026)
Product CategoryMemory
ManufacturerMicron Technology Inc.
Manufacturing StatusActive
Manufacturer Standard Lead Time26 Weeks
Datasheet

Specifications & Environmental

Device Package100-LBGA (14x18)Memory FormatFLASHTechnologyFLASH - NAND (TLC)
Memory Size32 GbitAccess TimeN/AGradeAutomotive
Clock Frequency32 HzVoltage2.7V ~ 3.6VMemory TypeNon-Volatile
Operating Temperature-40°C ~ 105°CWrite Cycle Time Word PageN/APackaging100-LBGA
Mounting MethodNon-VolatileMemory InterfaceParallelMemory Organization32G x 8
Moisture Sensitivity Level3 (168 Hours)RoHS ComplianceROHS3 CompliantREACH ComplianceREACH Unaffected
QualificationAEC-Q104ECCN3A991B1AHTS Code8542.32.0071

Overview of MTFC32GAZAQDW-AAT – IC FLASH 32GBIT PAR 100LBGA

The MTFC32GAZAQDW-AAT is a 32 Gbit non-volatile NAND flash memory device in a parallel interface format. It is built on TLC NAND flash technology and is offered as part of the e•MMC™ series.

Designed for applications that require compact, high-density flash storage, this device combines a 32G × 8 memory organization, a 100-LBGA (14 × 18) package, a 2.7 V to 3.6 V supply range, and an extended operating temperature range of −40 °C to 105 °C. It carries AEC-Q104 qualification and is specified as automotive grade.

Key Features

  • Memory Technology NAND flash (TLC) non-volatile memory with a 32 Gbit capacity in a 32G × 8 organization.
  • Interface Parallel memory interface for systems expecting parallel flash connectivity.
  • Power Supported supply range of 2.7 V to 3.6 V to match common system power rails.
  • Package 100-LBGA package (14 × 18 mm) for a compact board footprint.
  • Operating Range Specified operating temperature from −40 °C to 105 °C for use in temperature-challenging environments.
  • Qualification and Grade AEC-Q104 qualification and listed as Automotive grade.
  • Clock Frequency Clock frequency parameter listed as 32 Hz.

Typical Applications

  • Automotive systems Automotive-grade flash storage for electronic control, logging, or data storage functions where AEC-Q104 qualification and extended temperature range are required.
  • Embedded storage On-board non-volatile storage in embedded devices that require a 32 Gbit parallel NAND solution.
  • Industrial equipment High-density flash memory for industrial controllers and equipment operating across a wide temperature range.

Unique Advantages

  • High-density NAND storage: 32 Gbit capacity in a 32G × 8 organization provides significant non-volatile storage in a single device.
  • Automotive-grade qualification: AEC-Q104 qualification and Automotive grade designation support use in automotive environments.
  • Wide operating temperature: Rated from −40 °C to 105 °C to withstand temperature extremes common in automotive and industrial applications.
  • Compact LBGA footprint: 100-LBGA (14 × 18 mm) package minimizes board area for space-constrained designs.
  • Standard supply compatibility: 2.7 V to 3.6 V supply range aligns with common system power rails.
  • Parallel interface: Parallel memory interface for integration into systems that use parallel flash architectures.

Why Choose IC FLASH 32GBIT PAR 100LBGA?

The MTFC32GAZAQDW-AAT positions itself as a compact, high-density parallel NAND flash device with specifications targeted at automotive and industrial applications. Its 32 Gbit capacity, 100-LBGA packaging, and 2.7 V–3.6 V supply range make it suitable for designs that require substantial on-board non-volatile storage within a small footprint.

With AEC-Q104 qualification and an extended −40 °C to 105 °C operating window, this device offers robustness for temperature-challenging environments. It is well suited for engineers and procurement teams specifying parallel NAND flash where automotive-grade qualification and defined electrical and thermal parameters are required.

Request a quote or submit an inquiry for pricing and availability to evaluate the MTFC32GAZAQDW-AAT for your next design.

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