F59L4G81XB-25BG2X
| Part Description |
SLC NAND Flash, 4Gbit (512M × 8), 3.3V, 63-ball BGA |
|---|---|
| Quantity | 1,245 Available (as of May 6, 2026) |
Specifications & Environmental
| Device Package | BGA-63 | Memory Format | FLASH | Technology | NAND Flash - SLC | ||
|---|---|---|---|---|---|---|---|
| Memory Size | 4 Gbit | Access Time | 20 ns | Grade | Commercial | ||
| Clock Frequency | N/A | Voltage | 2.7V ~ 3.6V | Memory Type | Non-Volatile | ||
| Operating Temperature | 0°C – 70°C | Write Cycle Time Word Page | 200 µs | Packaging | 63-BGA | ||
| Mounting Method | Surface Mount | Memory Interface | Parallel | Memory Organization | 512M x 8 | ||
| Moisture Sensitivity Level | 3 | RoHS Compliance | Compliant | REACH Compliance | REACH Unknown | ||
| Qualification | N/A | ECCN | EAR99 | HTS Code | 8542.32.00.71 |
Overview of F59L4G81XB-25BG2X – SLC NAND Flash, 4Gbit (512M × 8), 3.3V, 63-ball BGA
The F59L4G81XB-25BG2X from ESMT is a 4.295 Gbit single-level cell (SLC) NAND Flash memory organized as 512M × 8. It provides a parallel, low pin-count asynchronous interface (ONFI 1.0-compliant) and is offered in a 63-ball BGA surface-mount package for compact system integration.
Designed for commercial-temperature embedded designs, the device supports 2.7–3.6V operation and includes on-die ECC options, multi-mode page/cache operations, and hardware status signals to simplify system-level control and reliability management.
Key Features
- Memory Architecture 4.295 Gbit capacity organized as 512M × 8 with a page size of 4,352 bytes (4,096 + 256) and a block size of 64 pages; single-plane configuration.
- Cell Technology Single-level cell (SLC) NAND Flash for non-volatile storage with endurance and retention characteristics specified in the datasheet.
- Performance Asynchronous I/O performance listed as RC/WC: 25 ns and an Access Time of 20 ns; read page and program timing options include read page up to 115 µs (with on-die ECC enabled) or 25 µs (with ECC disabled), and program page typical times of 200 µs (ECC disabled) or 240 µs (ECC enabled).
- Command Set & Features ONFI NAND Flash protocol support with advanced commands such as program/read page cache modes, internal data move, read unique ID, and SET FEATURE control for ECC and drive-strength configuration.
- Data Integrity & Control 8-bit internal ECC is available (disabled by default and toggleable via SET FEATURE). Hardware signals include Ready/Busy# (R/B#) and a WP# for device write protection. RESET (FFh) is required after power-on.
- Reliability Endurance specified at 100,000 program/erase cycles and data retention compliant with JESD47G; uncycled data retention specified as 10 years continuous at 70°C.
- Power & Temperature Supply voltage range 2.7–3.6V. Commercial operating temperature range 0 °C to 70 °C.
- Package & Mounting Pb-free 63-ball BGA (BGA-63) surface-mount package for compact board-level integration.
Unique Advantages
- High Endurance: 100,000 program/erase cycles support sustained write/erase workloads where SLC endurance is required.
- Selectable On-Die ECC: 8-bit internal ECC can be enabled or disabled via the SET FEATURE command, allowing trade-offs between maximum throughput and error protection.
- Flexible Timing Modes: Multiple documented program/read timing options (including cache modes) let designers tune performance for specific system requirements.
- Low Pin-Count Parallel Interface: Multiplexed 8-bit I/O plus standard control pins (CE#, CLE, ALE, WE#, RE#) minimize board routing while preserving a standard pinout across densities.
- Robust Data Retention: Uncycled data retention specified as 10 years at 70 °C provides long-term storage assurance for non-volatile data.
- Compact Surface-Mount Package: 63-ball BGA simplifies high-density PCB layouts and is suitable for space-constrained embedded systems.
Why Choose F59L4G81XB-25BG2X?
The F59L4G81XB-25BG2X positions itself as a durable, configurable SLC NAND Flash solution for embedded designs requiring dependable non-volatile storage, flexible ECC control, and compact packaging. With ONFI 1.0 compatibility, selectable on-die ECC, and documented performance/latency modes, it supports designers who need predictable behavior across read/program/erase cycles.
Its commercial temperature rating, wide supply voltage range, and surface-mount BGA package make it well suited for high-reliability consumer and industrial embedded applications where integration density, endurance, and long-term data retention are priorities.
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