UWT1V151MNL1GS

The UWT1V151MNL1GS is a chip-type aluminum electrolytic capacitor engineered for surface-mount, high-density PCB assemblies. It offers 150 µF capacitance at a 35 V rating in a compact radial can SMD package, combining wide operating temperature capability with assembly-friendly packaging.

Targeted at demanding electronics environments, this part is AEC-Q200 qualified and RoHS compliant, providing documented endurance and performance across a broad −55 °C to +105 °C temperature range.

Key Features

• Capacitance & Voltage — 150 µF rated capacitance at 35 V with ±20% tolerance, suitable for bulk decoupling and power filtering tasks on modern PCBs.
• Wide Temperature Range — Specified operation from −55 °C to +105 °C for use in temperature-challenging environments.
• Reliability & Qualification — AEC-Q200 qualified with RoHS compliance; endurance validated to 1000 hours at 105 °C with capacitance change within ±20% for 25 V and higher parts.
• Leakage Current — Leakage specified as not more than 0.01CV or 3 µA (whichever is greater) after 2 minutes at 20 °C, aiding predictable bias behavior.
• Loss and Low-Temperature Performance — Maximum tan δ of 0.14 at 35 V (measured at 120 Hz, 20 °C); low-temperature impedance ratios of Z(−25 °C)/Z(+20 °C) = 2 and Z(−40 °C)/Z(+20 °C) = 3 for 35 V parts.
• Ripple Current Ratings — 155 mA at 120 Hz and 232.5 mA at 10 kHz, supporting AC ripple handling in power circuits.
• Assembly-Friendly Package — Chip-type radial can SMD designed for surface mounting on high-density PC boards and compatible with automatic mounting machines fed by carrier tape; surface mount land size specified as 8.3 × 8.3 mm.
• Process Robustness — Meets soldering heat resistance requirements with capacitance change within ±10% after exposure to specified reflow conditions; case top marked with black print for polarity and identification.

Typical Applications

• Automotive Electronics — AEC-Q200 qualification and wide temperature rating make this capacitor suitable for vehicle electronic modules requiring validated endurance and stability.
• High-Density PCB Power Filtering — Chip SMD format and defined land pattern support compact power supply decoupling and bulk storage on tightly packed boards.
• Automated Production Lines — Designed for compatibility with carrier-tape fed automatic mounting machines, simplifying high-volume assembly.
• Temperature-Critical Systems — Specified −55 °C to +105 °C operation and low-temperature impedance data support use where thermal extremes impact performance.

Unique Advantages

• Documented Automotive Qualification: AEC-Q200 listing provides confidence for designs targeting automotive-grade systems and environments.
• Wide Operating Temperature: −55 °C to +105 °C rating reduces the need for temperature derating or additional thermal mitigation in many applications.
• Proven Endurance: 1000 hours at 105 °C endurance with defined limits on capacitance, tan δ and leakage current supports long-term reliability planning.
• predictable Leakage Behavior: Clear leakage specification (≤ 0.01CV or 3 µA after 2 minutes at 20 °C) allows accurate bias and standby current budgeting.
• Assembly Efficiency: Carrier-tape compatibility and an SMD radial-can package streamline automated placement on high-density boards.
• Measured AC Performance: Published ripple current values at 120 Hz and 10 kHz help match the component to switching and ripple conditions in power converters.

Why Choose UWT1V151MNL1GS?

The UWT1V151MNL1GS positions itself as a compact, reliably characterized electrolytic capacitor for designs that require validated performance over a wide temperature range and in production-ready SMD form. Its AEC-Q200 qualification, RoHS compliance, and endurance data make it suitable for engineered deployments where traceable specifications matter.

This part is a fit for engineers and procurement teams developing automotive-grade and temperature-challenged systems who need a surface-mount electrolytic with defined leakage, ripple current, and longevity characteristics backed by documented test conditions.

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