IS45S32400E-6TLA1

IC DRAM 128MBIT PAR 86TSOP II
Part Description

IC DRAM 128MBIT PAR 86TSOP II

Quantity 1,439 Available (as of May 5, 2026)
Product CategoryMemory
ManufacturerIntegrated Silicon Solution Inc
Manufacturing StatusObsolete
Manufacturer Standard Lead TimeRFQ
Datasheet

Specifications & Environmental

Device Package86-TSOP IIMemory FormatDRAMTechnologySDRAM
Memory Size128 MbitAccess Time5.4 nsGradeIndustrial
Clock Frequency166 MHzVoltage3V ~ 3.6VMemory TypeVolatile
Operating Temperature-40°C ~ 85°C (TA)Write Cycle Time Word PageN/APackaging86-TFSOP (0.400", 10.16mm Width)
Mounting MethodVolatileMemory InterfaceParallelMemory Organization4M x 32
Moisture Sensitivity Level3 (168 Hours)RoHS ComplianceROHS CompliantREACH ComplianceREACH Unaffected
QualificationN/AECCNEAR99HTS Code8542.32.0002

Overview of IS45S32400E-6TLA1 – IC DRAM 128MBIT PAR 86TSOP II

The IS45S32400E-6TLA1 is a 128Mbit synchronous DRAM organized as 4M × 32 with a parallel interface and quad-bank internal architecture. It uses a pipelined, fully synchronous design to support high-speed data transfer in 3.3V memory systems.

Designed for systems requiring a compact board-level DRAM, the device offers programmable burst modes, selectable CAS latency, and standard 86-pin TSOP-II packaging to simplify integration into parallel memory subsystems operating across commercial and industrial temperature ranges.

Key Features

  • Core / Architecture  Quad-bank synchronous DRAM internally organized as 1M × 32 × 4 banks for parallel access and bank-overlap operations.
  • Memory Capacity & Organization  128 Mbit total capacity arranged as 4M × 32, suitable for 32-bit wide memory buses.
  • Performance & Timing  Clock frequency up to 166 MHz (−6 speed grade) with programmable CAS latency (2 or 3 clocks) and access time as low as 5.4 ns for CL=3.
  • Burst & Access Modes  Programmable burst length (1, 2, 4, 8, full page) and selectable burst sequence (sequential or interleave) with burst read/write and burst read/single write support.
  • Refresh & Self-Maintenance  Auto refresh (CBR) and self-refresh supported; refresh rates of 4096 cycles per 16 ms (A2) or 64 ms (commercial/industrial/A1 options) as specified.
  • Interface & Signaling  LVTTL-compatible parallel interface with all signals referenced to the positive clock edge for fully synchronous operation.
  • Power  Single power supply operation at 3.0 V to 3.6 V (3.3 V ±0.3 V specified in the datasheet).
  • Package & Temperature  Available in an 86-pin TSOP-II (86-TFSOP, 0.400" / 10.16 mm width) and rated for operating temperatures down to −40°C up to +85°C (industrial grade).

Typical Applications

  • 3.3 V Memory Subsystems  Acts as board-level SDRAM in systems designed for a 3.3 V memory supply.
  • Parallel Bus Designs  Provides 32-bit wide, parallel DRAM storage for designs requiring 4M × 32 organization and burst-access capability.
  • Industrial Temperature Systems  Suitable for equipment operating across commercial and industrial ambient ranges (−40°C to +85°C).

Unique Advantages

  • Flexible Burst Control: Programmable burst lengths and sequence options let designers optimize throughput and latency for varied access patterns.
  • Selectable CAS Latency: CAS latency options (2 or 3 clocks) enable tuning of access timing to match system clocking and performance targets.
  • High-Speed Synchronous Operation: Up to 166 MHz clocking with pipeline architecture supports rapid, predictable data transfer referenced to the clock edge.
  • Integrated Refresh Support: Built-in auto refresh and self-refresh mechanisms simplify system refresh management and maintain data integrity.
  • Industry-Grade Temperature Range: Specified operation from −40°C to +85°C to meet harsher ambient requirements.
  • Standard TSOP-II Packaging: 86-pin TSOP-II footprint (10.16 mm width) for compact board-level implementation.

Why Choose IC DRAM 128MBIT PAR 86TSOP II?

The IS45S32400E-6TLA1 combines a 128 Mbit synchronous DRAM organization with a quad-bank, pipelined architecture to deliver predictable, high-speed parallel memory for 3.3 V systems. Its programmable burst modes, selectable CAS latency, and integrated refresh features provide design flexibility for system-level timing and throughput requirements.

This device is well suited to engineers specifying 32-bit parallel DRAM in compact TSOP-II packages who require industrial temperature operation and configurable timing/refresh behavior. The combination of standard packaging, documented timing parameters, and multiple operating speed grades helps simplify integration and validation in board-level memory subsystems.

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