F59D1G161LB-45BG2M

1Gb NAND Flash
Part Description

SLC NAND Flash, 1Gbit, 1.8V, x16, 45ns, 63-ball BGA

Quantity 1,336 Available (as of May 5, 2026)
Product CategoryMemory
ManufacturerESMT
Manufacturing StatusMP
Manufacturer Standard Lead TimeRFQ
Datasheet

Specifications & Environmental

Device PackageBGA-63Memory FormatFLASHTechnologyNAND Flash - SLC
Memory Size1 GbitAccess Time30 nsGradeCommercial
Clock FrequencyN/AVoltage1.7V ~ 1.95VMemory TypeNon-Volatile
Operating Temperature0°C – 70°CWrite Cycle Time Word Page350 µsPackaging63-BGA
Mounting MethodSurface MountMemory InterfaceParallelMemory Organization64M x 16
Moisture Sensitivity Level3RoHS ComplianceCompliantREACH ComplianceREACH Unknown
QualificationN/AECCNEAR99HTS Code8542.32.00.71

Overview of F59D1G161LB-45BG2M – SLC NAND Flash, 1Gbit, 1.8V, x16, 45ns, 63-ball BGA

The F59D1G161LB-45BG2M is a 1.074 Gbit single-level cell (SLC) NAND Flash memory organized as 64M x 16, offered in a 63-ball BGA package. It operates from a 1.8V supply (1.7 V to 1.95 V) and targets solid-state mass storage and embedded non-volatile memory applications that require robust program/erase endurance and straightforward parallel interface integration.

Designed for systems that need reliable block-oriented storage, this device provides on-chip features such as automatic program/erase, cache and copy-back operations, and boot-from-NAND support to streamline firmware and data management in embedded designs.

Key Features

  • Memory Core 1.074 Gbit SLC NAND organized as 64M × 16 bits with 1bit per memory cell for predictable program/erase behavior.
  • Performance 45 ns speed grade available for the 63-ball BGA package; Access time is listed at 30 ns in product specifications. Page program and block erase operations are supported with fast program/erase cycles.
  • Program / Erase Characteristics Automatic program and erase operations with a write (word/page) cycle time of 350 µs and typical block erase times referenced in the series documentation.
  • Data Transfer and Interface Parallel NAND interface with command/address/data multiplexed I/O port and cache read/program features to improve throughput for sequential page operations.
  • Reliability & Endurance Endurance specified at 60K program/erase cycles and data retention of 10 years as documented for the series. ECC requirement for x16 organization is 1 bit per 256 words.
  • System Support Features Supports copy-back, cache program/read, automatic page 0 read at power-up option, boot-from-NAND support, One Time Program (OTP), and bad-block protection mechanisms.
  • Power Single 1.8V supply range: 1.7 V to 1.95 V, suitable for low-voltage embedded systems.
  • Package & Temperature Surface-mount 63-ball BGA (BGA-63) package; commercial operating temperature range 0 °C to 70 °C.
  • Standards & Compliance RoHS-compliant lead-free package option as provided in the product ordering information.

Typical Applications

  • Solid-State Storage Use as the primary NAND in compact solid-state mass storage devices where SLC endurance and retention are required.
  • Embedded Systems Ideal for firmware and data storage in embedded controllers and devices that require boot-from-NAND capability and reliable block management.
  • Industrial and Consumer Electronics Suitable for devices requiring non-volatile program and data storage within a surface-mount BGA footprint and 1.8V power domain.

Unique Advantages

  • SLC Architecture: Provides 1 bit per cell operation for consistent program/erase characteristics and long-term data retention.
  • High Endurance: 60K program/erase cycles and 10-year data retention deliver long operational life for firmware and frequent-update storage.
  • Parallel Interface with Cache Support: Command/address/data multiplexed I/O plus cache program/read and copy-back operations improve throughput for sequential reads/writes.
  • Low-Voltage Operation: 1.7 V to 1.95 V supply simplifies integration into modern 1.8V system power domains.
  • Compact BGA Package: 63-ball BGA offers a small surface-mount footprint for space-constrained PCB layouts.
  • System Reliability Features: Bad-block protection, OTP, and automatic page-read-at-power-up options help simplify deployment and boot flows.

Why Choose F59D1G161LB-45BG2M?

The F59D1G161LB-45BG2M combines SLC NAND reliability with features targeted to embedded and storage applications: a compact BGA package, low-voltage operation, and on-chip mechanisms for efficient program, read and block management. Its endurance and retention numbers make it suitable for designs that require durable non-volatile storage and predictable behavior over product life.

This part is appropriate for engineers and procurement teams designing compact, low-voltage systems that need parallel NAND Flash with boot and cache capabilities, robust bad-block handling, and documented ECC requirements for x16 organization.

Request a quote or submit an inquiry to discuss volume pricing, availability, and delivery for the F59D1G161LB-45BG2M.

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