F59D8G81KSA-45BG2R

8Gb NAND Flash
Part Description

SLC NAND Flash, 8Gbit, 1.8V, 45ns, 63-ball BGA

Quantity 242 Available (as of May 5, 2026)
Product CategoryMemory
ManufacturerESMT
Manufacturing StatusActive
Manufacturer Standard Lead TimeRFQ
Datasheet

Specifications & Environmental

Device PackageBGA-63Memory FormatFLASHTechnologyNAND Flash - SLC
Memory Size8 GbitAccess Time20 nsGradeCommercial
Clock FrequencyN/AVoltage1.7V ~ 1.95VMemory TypeNon-Volatile
Operating Temperature0°C – 70°CWrite Cycle Time Word Page200 µsPackaging63-BGA
Mounting MethodSurface MountMemory InterfaceParallelMemory Organization512M x 8 x 2 die
Moisture Sensitivity Level3RoHS ComplianceCompliantREACH ComplianceREACH Unknown
QualificationN/AECCNEAR99HTS Code8542.32.00.71

Overview of F59D8G81KSA-45BG2R – SLC NAND Flash, 8Gbit, 1.8V, 45ns, 63-ball BGA

The F59D8G81KSA-45BG2R is an 8 Gbit SLC NAND Flash memory device from ESMT, organized as 512M × 8 × 2 die and presented in a 63-ball BGA package. It implements single-level-cell (SLC) NAND architecture with a parallel x8 I/O interface and 1.8 V nominal operation (VCC 1.7 V–1.95 V).

This device is targeted at embedded non-volatile storage applications that require SLC endurance and predictable program/erase characteristics, supporting functions such as boot-from-NAND, automatic program/erase cycles, cache read/program and copy-back operations.

Key Features

  • Memory Density & Organization — 8.59 Gbit nominal capacity (stamped as 8Gb composed of 4Gb × 2 dies) with internal organization of 512M × 8 × 2 die and 4352-byte data/register increment transfers.
  • Page & Block Architecture — Page size of (4K + 256) bytes and block size of 64 pages (256K + 16K bytes), enabling block erase and page program operations.
  • Performance — Read cycle speed associated with the -45 grade (45 ns read cycle listed in datasheet ordering); product specifications also list an access time of 20 ns and Random Read up to 25 μs (max for random read operation).
  • Program & Erase Timing — Page Program time shown in the datasheet as 400 μs (typ.) and 700 μs (max.); Block Erase time shown as 3.5 ms (typ.) and 10 ms (max.). The product specification also lists a write cycle time (word/page) of 200 μs.
  • Endurance & Retention — SLC endurance of 60K P/E cycles and uncycled data retention of 10 years at 55°C as specified in the datasheet.
  • ECC & Reliability — Datasheet specifies an ECC requirement of 8-bit per 512-byte to support reliable data integrity; device includes automatic program/erase and hardware data protection features.
  • Voltage & Interface — Low-voltage operation VCC = 1.8 V (operating range 1.7 V–1.95 V) with command/address/data multiplexed on the DQ port and an x8 parallel interface.
  • Package & Mounting — 63-ball BGA (BGA-63) surface-mount package; supplier device package listed as BGA-63.
  • Compliance & Grade — Commercial grade device with RoHS compliance indicated in the product data.
  • Boot & System Features — Supports automatic page 0 read at power-up, boot-from-NAND support and automatic memory download as described in the datasheet.

Typical Applications

  • Embedded Storage — Use as high-density non-volatile storage for embedded systems that require SLC reliability and erase/program control.
  • Solid-State File Storage — Suitable for file storage applications where predictable program/erase cycles and block-level erase are required.
  • Consumer Recording Devices — Applicable for voice recorders and image file memory in still cameras where SLC endurance and data retention are desirable.
  • Boot & System Initialization — Support for automatic page 0 read at power-up and boot-from-NAND use cases in systems that require a NAND-resident boot image.

Unique Advantages

  • SLC Endurance: 60K program/erase cycles provide robust cycle life for write-intensive embedded applications.
  • Low-Voltage Operation: 1.7 V–1.95 V supply range with 1.8 V nominal operation enables integration into low-voltage platforms.
  • Stacked Die Organization: 4Gb × 2 die stacking yields an 8Gb device with internal register buffering for 4352-byte transfers to streamline program/read workflows.
  • Program/Erase Control & Protections: Automatic program/erase operations, hardware data protection and program/erase lockout during power transitions enhance operational reliability.
  • System Boot Capability: Built-in support for automatic page 0 read at power-up and boot-from-NAND functionality simplifies system initialization design.
  • RoHS Compliant: Meets RoHS requirements for environmental compliance in commercial applications.

Why Choose F59D8G81KSA-45BG2R?

The F59D8G81KSA-45BG2R combines SLC NAND endurance and a stacked 2-die organization to deliver reliable non-volatile storage for embedded and consumer applications. With defined program and erase timings, ECC guidance, and boot-support features, it suits designs that require predictable lifecycle characteristics and straightforward boot integration.

This commercial-grade, low-voltage 1.8 V NAND in a compact 63-ball BGA package is appropriate for engineers designing embedded storage subsystems, consumer recording devices, or systems requiring NAND-based boot and memory download capabilities, while benefiting from documented endurance and retention figures described in the product specifications and datasheet.

Request a quote or submit an inquiry to receive pricing and availability information for the F59D8G81KSA-45BG2R.

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