F59D8G81KSA-45BG2R
| Part Description |
SLC NAND Flash, 8Gbit, 1.8V, 45ns, 63-ball BGA |
|---|---|
| Quantity | 242 Available (as of May 5, 2026) |
Specifications & Environmental
| Device Package | BGA-63 | Memory Format | FLASH | Technology | NAND Flash - SLC | ||
|---|---|---|---|---|---|---|---|
| Memory Size | 8 Gbit | Access Time | 20 ns | Grade | Commercial | ||
| Clock Frequency | N/A | Voltage | 1.7V ~ 1.95V | Memory Type | Non-Volatile | ||
| Operating Temperature | 0°C – 70°C | Write Cycle Time Word Page | 200 µs | Packaging | 63-BGA | ||
| Mounting Method | Surface Mount | Memory Interface | Parallel | Memory Organization | 512M x 8 x 2 die | ||
| Moisture Sensitivity Level | 3 | RoHS Compliance | Compliant | REACH Compliance | REACH Unknown | ||
| Qualification | N/A | ECCN | EAR99 | HTS Code | 8542.32.00.71 |
Overview of F59D8G81KSA-45BG2R – SLC NAND Flash, 8Gbit, 1.8V, 45ns, 63-ball BGA
The F59D8G81KSA-45BG2R is an 8 Gbit SLC NAND Flash memory device from ESMT, organized as 512M × 8 × 2 die and presented in a 63-ball BGA package. It implements single-level-cell (SLC) NAND architecture with a parallel x8 I/O interface and 1.8 V nominal operation (VCC 1.7 V–1.95 V).
This device is targeted at embedded non-volatile storage applications that require SLC endurance and predictable program/erase characteristics, supporting functions such as boot-from-NAND, automatic program/erase cycles, cache read/program and copy-back operations.
Key Features
- Memory Density & Organization — 8.59 Gbit nominal capacity (stamped as 8Gb composed of 4Gb × 2 dies) with internal organization of 512M × 8 × 2 die and 4352-byte data/register increment transfers.
- Page & Block Architecture — Page size of (4K + 256) bytes and block size of 64 pages (256K + 16K bytes), enabling block erase and page program operations.
- Performance — Read cycle speed associated with the -45 grade (45 ns read cycle listed in datasheet ordering); product specifications also list an access time of 20 ns and Random Read up to 25 μs (max for random read operation).
- Program & Erase Timing — Page Program time shown in the datasheet as 400 μs (typ.) and 700 μs (max.); Block Erase time shown as 3.5 ms (typ.) and 10 ms (max.). The product specification also lists a write cycle time (word/page) of 200 μs.
- Endurance & Retention — SLC endurance of 60K P/E cycles and uncycled data retention of 10 years at 55°C as specified in the datasheet.
- ECC & Reliability — Datasheet specifies an ECC requirement of 8-bit per 512-byte to support reliable data integrity; device includes automatic program/erase and hardware data protection features.
- Voltage & Interface — Low-voltage operation VCC = 1.8 V (operating range 1.7 V–1.95 V) with command/address/data multiplexed on the DQ port and an x8 parallel interface.
- Package & Mounting — 63-ball BGA (BGA-63) surface-mount package; supplier device package listed as BGA-63.
- Compliance & Grade — Commercial grade device with RoHS compliance indicated in the product data.
- Boot & System Features — Supports automatic page 0 read at power-up, boot-from-NAND support and automatic memory download as described in the datasheet.
Typical Applications
- Embedded Storage — Use as high-density non-volatile storage for embedded systems that require SLC reliability and erase/program control.
- Solid-State File Storage — Suitable for file storage applications where predictable program/erase cycles and block-level erase are required.
- Consumer Recording Devices — Applicable for voice recorders and image file memory in still cameras where SLC endurance and data retention are desirable.
- Boot & System Initialization — Support for automatic page 0 read at power-up and boot-from-NAND use cases in systems that require a NAND-resident boot image.
Unique Advantages
- SLC Endurance: 60K program/erase cycles provide robust cycle life for write-intensive embedded applications.
- Low-Voltage Operation: 1.7 V–1.95 V supply range with 1.8 V nominal operation enables integration into low-voltage platforms.
- Stacked Die Organization: 4Gb × 2 die stacking yields an 8Gb device with internal register buffering for 4352-byte transfers to streamline program/read workflows.
- Program/Erase Control & Protections: Automatic program/erase operations, hardware data protection and program/erase lockout during power transitions enhance operational reliability.
- System Boot Capability: Built-in support for automatic page 0 read at power-up and boot-from-NAND functionality simplifies system initialization design.
- RoHS Compliant: Meets RoHS requirements for environmental compliance in commercial applications.
Why Choose F59D8G81KSA-45BG2R?
The F59D8G81KSA-45BG2R combines SLC NAND endurance and a stacked 2-die organization to deliver reliable non-volatile storage for embedded and consumer applications. With defined program and erase timings, ECC guidance, and boot-support features, it suits designs that require predictable lifecycle characteristics and straightforward boot integration.
This commercial-grade, low-voltage 1.8 V NAND in a compact 63-ball BGA package is appropriate for engineers designing embedded storage subsystems, consumer recording devices, or systems requiring NAND-based boot and memory download capabilities, while benefiting from documented endurance and retention figures described in the product specifications and datasheet.
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Date Founded: 1998
Headquarters: Hsinchu Science Park, Hsinchu, Taiwan
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Revenue: $377.8 Million
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