IS43DR16160A-3DBL-TR
| Part Description |
IC DRAM 256MBIT PAR 84TWBGA |
|---|---|
| Quantity | 172 Available (as of May 5, 2026) |
| Product Category | Memory |
|---|---|
| Manufacturer | Integrated Silicon Solution Inc |
| Manufacturing Status | Obsolete |
| Manufacturer Standard Lead Time | RFQ |
| Datasheet |
Specifications & Environmental
| Device Package | 84-TWBGA (8x12.5) | Memory Format | DRAM | Technology | SDRAM - DDR2 | ||
|---|---|---|---|---|---|---|---|
| Memory Size | 256 Mbit | Access Time | 450 ps | Grade | Commercial | ||
| Clock Frequency | 333 MHz | Voltage | 1.7V ~ 1.9V | Memory Type | Volatile | ||
| Operating Temperature | 0°C ~ 70°C (TA) | Write Cycle Time Word Page | 15 ns | Packaging | 84-TFBGA | ||
| Mounting Method | Volatile | Memory Interface | Parallel | Memory Organization | 16M x 16 | ||
| Moisture Sensitivity Level | 3 (168 Hours) | RoHS Compliance | ROHS3 Compliant | REACH Compliance | REACH Unaffected | ||
| Qualification | N/A | ECCN | EAR99 | HTS Code | 8542.32.0024 |
Overview of IS43DR16160A-3DBL-TR – IC DRAM 256Mbit PAR 84TWBGA
The IS43DR16160A-3DBL-TR is a 256 Mbit DDR2 SDRAM organized as 16M × 16 with a parallel memory interface in an 84-ball WBGA package (8 mm × 12.5 mm). It uses a double-data-rate architecture and on-chip timing features to deliver high-speed parallel memory transfers.
This device is intended for designs that require a compact, low-voltage (1.7 V–1.9 V) DDR2 memory solution with programmable latency and on-die signal conditioning for reliable high-speed operation. Operating ambient temperature is specified as 0°C to 70°C.
Key Features
- Memory Architecture 256 Mbit DDR2 SDRAM organized as 16M × 16 with a parallel interface and 4 internal banks for concurrent operation.
- Double-Data-Rate Interface DDR2 double-data-rate transfers provide two data words per clock cycle; differential data strobe (DQS/ /DQS) is supported for aligned data capture.
- Timing and Performance On-chip DLL for DQ/DQS alignment, programmable CAS latency (CL = 3, 4, 5, 6) and programmable additive latency (AL = 0–5); programmable burst lengths of 4 or 8.
- Signal Integrity JEDEC-standard 1.8 V I/O (SSTL_18-compatible), adjustable data-output drive strength and on-die termination (ODT) to help optimize board-level signal quality.
- Prefetch and Internal Design 4-bit prefetch architecture to support the DDR2 interface and efficient data throughput.
- Key Electrical & Timing Specs Supply voltage 1.7 V–1.9 V; clock frequency listed at 333 MHz; access time 450 ps; write cycle time (word/page) 15 ns.
- Package & Temperature 84-TWBGA (8 mm × 12.5 mm) package; ambient operating temperature 0°C to 70°C.
Typical Applications
- Embedded memory subsystems Compact DDR2 256 Mbit storage for systems requiring parallel DRAM in a small WBGA footprint.
- High-speed data buffering Use where double-data-rate transfers and programmable latencies are needed to match system timing.
- Board-level memory expansion Integration into designs that require a low-voltage (1.7 V–1.9 V) DDR2 device with on-die termination and drive-strength options.
Unique Advantages
- Double-data-rate transfers: Provides two data words per clock cycle for improved throughput compared to single-data-rate devices.
- Programmable timing flexibility: Multiple CAS latency and additive latency settings allow tuning to host controller timing requirements.
- On-die signal conditioning: DLL, adjustable drive strength and ODT help simplify board-level signal integrity design.
- Compact WBGA package: 84-ball WBGA (8 mm × 12.5 mm) minimizes PCB area for space-constrained applications.
- Low-voltage operation: 1.7 V–1.9 V supply range supports low-voltage system designs while maintaining DDR2 interface compatibility.
Why Choose IS43DR16160A-3DBL-TR?
The IS43DR16160A-3DBL-TR positions itself as a compact DDR2 SDRAM option that balances performance and integration: DDR2 double-data-rate transfers, on-chip DLL and ODT, and programmable timing options let designers tune throughput and signal behavior to system needs. Its 16M × 16 organization and 256 Mbit capacity make it suitable where moderate-density parallel DRAM is required in a small WBGA package.
This device is appropriate for engineers specifying low-voltage DDR2 memory with explicit timing control and board-level signal management. The datasheet-provided timing and electrical parameters offer verifiable design inputs for system integration and long-term bill-of-material planning.
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