MT29F64G08CBABAL84A3WC1-M

IC FLASH 64GBIT PARALLEL DIE
Part Description

IC FLASH 64GBIT PARALLEL DIE

Quantity 1,239 Available (as of May 5, 2026)
Product CategoryMemory
ManufacturerMicron Technology Inc.
Manufacturing StatusObsolete
Manufacturer Standard Lead TimeRFQ
Datasheet

Specifications & Environmental

Device PackageDieMemory FormatFLASHTechnologyFLASH - NAND
Memory Size64 GbitAccess TimeN/AGradeCommercial
Clock FrequencyN/AVoltage2.7V ~ 3.6VMemory TypeNon-Volatile
Operating Temperature0°C ~ 70°C (TA)Write Cycle Time Word PageN/APackagingDie
Mounting MethodNon-VolatileMemory InterfaceParallelMemory Organization8G x 8
Moisture Sensitivity LevelN/ARoHS ComplianceUnknownREACH ComplianceREACH Unknown
QualificationN/AECCNOBSOLETEHTS Code0000.00.0000

Overview of MT29F64G08CBABAL84A3WC1-M – IC FLASH 64GBIT PARALLEL DIE

The MT29F64G08CBABAL84A3WC1-M is a 64 Gbit non-volatile NAND flash memory provided as a die. It is organized as 8G × 8 and uses a parallel memory interface, targeting designs that require die-level NAND flash capacity and integration.

Key device characteristics include NAND flash technology, a 2.7 V to 3.6 V supply range, and an ambient operating temperature range of 0°C to 70°C, making it suitable for standard commercial embedded storage applications.

Key Features

  • Memory Core (FLASH - NAND) Non-volatile NAND flash memory technology offering persistent data retention without power.
  • Density & Organization 64 Gbit total capacity with an organization of 8G × 8 for byte-wide data handling.
  • Interface Parallel memory interface provided at die level for integration into custom package or board-level designs.
  • Power Operates from a 2.7 V to 3.6 V supply range, compatible with common 3 V system voltages.
  • Package Supplied as a die (Supplier Device Package: Die) for direct die integration or multi-die assemblies.
  • Temperature Range Rated for ambient operation from 0°C to 70°C (TA).

Typical Applications

  • Embedded Storage Provides non-volatile storage for code and data in embedded systems requiring NAND flash capacity.
  • Die-Level Integration Die form factor enables integration into custom packages, multi-die modules, or OEM-specific assemblies.
  • Firmware and Data Retention 64 Gbit density supports storage of firmware images, large datasets, or system-level non-volatile requirements.

Unique Advantages

  • High Density — 64 Gbit: Offers significant storage capacity in a single die to consolidate non-volatile memory needs.
  • Byte-Organized Memory (8G × 8): Organization supports byte-wide data access and straightforward integration with parallel memory controllers.
  • Parallel Interface: Enables direct parallel memory bus integration for systems designed around parallel flash architectures.
  • Wide Supply Range: 2.7 V to 3.6 V operation aligns with common 3 V system rails for flexible power design.
  • Die Form Factor: Delivered as a die for OEMs and integrators needing custom packaging or multi-die assemblies.
  • Commercial Temperature Range: Specified for 0°C to 70°C ambient operation appropriate for standard commercial environments.

Why Choose MT29F64G08CBABAL84A3WC1-M?

The MT29F64G08CBABAL84A3WC1-M positions itself as a straightforward, high-density NAND flash die option for designs that require non-volatile storage at the die level. Its 64 Gbit capacity, 8G × 8 organization, and parallel interface make it suitable for integration into custom packages or systems where die-level memory is preferred.

Engineers and procurement teams seeking a die-form NAND solution with a common 2.7 V–3.6 V supply and a commercial operating temperature range will find this product appropriate for embedded storage and firmware retention use cases where die integration and density are primary considerations.

Request a quote or contact sales for pricing, availability, and integration support for the MT29F64G08CBABAL84A3WC1-M.

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