MT29F64G08CBCGBL04A3WC1-M

IC FLASH 64GBIT PARALLEL DIE
Part Description

IC FLASH 64GBIT PARALLEL DIE

Quantity 1,011 Available (as of May 5, 2026)
Product CategoryMemory
ManufacturerMicron Technology Inc.
Manufacturing StatusObsolete
Manufacturer Standard Lead TimeRFQ
Datasheet

Specifications & Environmental

Device PackageDieMemory FormatFLASHTechnologyFLASH - NAND
Memory Size64 GbitAccess TimeN/AGradeCommercial
Clock FrequencyN/AVoltage2.7V ~ 3.6VMemory TypeNon-Volatile
Operating Temperature0°C ~ 70°C (TA)Write Cycle Time Word PageN/APackagingDie
Mounting MethodNon-VolatileMemory InterfaceParallelMemory Organization8G x 8
Moisture Sensitivity Level3 (168 Hours)RoHS ComplianceROHS3 CompliantREACH ComplianceREACH Unaffected
QualificationN/AECCN3A991B1AHTS Code8542.32.0071

Overview of MT29F64G08CBCGBL04A3WC1-M – IC FLASH 64GBIT PARALLEL DIE

The MT29F64G08CBCGBL04A3WC1-M is a 64 Gbit non-volatile FLASH NAND memory die from Micron Technology Inc., organized as 8G × 8 with a parallel memory interface. It provides die-level NAND storage intended for integration into designs that require parallel FLASH memory.

The device operates from 2.7 V to 3.6 V and is specified for ambient operation from 0°C to 70°C (TA), enabling use in systems that match these electrical and thermal parameters.

Key Features

  • Memory — 64 Gbit NAND Non-volatile FLASH NAND memory with a total capacity of 64 Gbit organized as 8G × 8.
  • Interface — Parallel Parallel memory interface for integration into systems that use parallel NAND connectivity.
  • Voltage — 2.7 V to 3.6 V Operates across a supply voltage range of 2.7 V to 3.6 V to match common system rails.
  • Thermal — 0°C–70°C (TA) Specified ambient operating temperature range of 0°C to 70°C.
  • Package — Die Supplied as a die (Supplier Device Package: Die) for direct die integration or custom packaging workflows.
  • Technology — FLASH (NAND) NAND FLASH memory format providing non-volatile storage at die level.

Typical Applications

  • Embedded systems — Provides parallel NAND non-volatile storage for embedded designs that require die-level memory integration.
  • Custom memory subsystems — Suitable for custom storage modules and multi-die assemblies needing 64 Gbit capacity in a die form.
  • Integration into bespoke electronics — Used where direct die integration of parallel NAND FLASH is required to meet form-factor or packaging constraints.

Unique Advantages

  • High-density storage: 64 Gbit capacity with an 8G × 8 organization delivers substantial storage per die.
  • Parallel interface compatibility: Native parallel memory interface supports designs built around parallel NAND architectures.
  • Flexible supply range: 2.7 V–3.6 V operation aligns with common system power rails for straightforward integration.
  • Die-level integration: Supplied as a die to enable custom packaging, multi-die assemblies, or direct die placement strategies.
  • Defined operating conditions: Specified ambient temperature range (0°C–70°C) and electrical limits provide clear design constraints.

Why Choose IC FLASH 64GBIT PARALLEL DIE?

The MT29F64G08CBCGBL04A3WC1-M positions itself as a straightforward, die-level NAND FLASH solution from Micron Technology Inc. for designs that require a 64 Gbit parallel NAND device with defined electrical and thermal specifications. Its 8G × 8 organization, parallel interface, and 2.7 V–3.6 V supply window make it suitable for integration into custom memory subsystems and products that demand die-form FLASH.

Engineers and procurement teams selecting this die will benefit from clear capacity and interface characteristics, die-level packaging for integration flexibility, and documented operating ranges to guide system design and qualification.

Request a quote or submit an inquiry to check availability and pricing for the MT29F64G08CBCGBL04A3WC1-M.

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