W25N512GVBIT

IC FLASH 512MBIT SPI 24TFBGA
Part Description

IC FLASH 512MBIT SPI 24TFBGA

Quantity 633 Available (as of May 4, 2026)
Product CategoryMemory
ManufacturerWinbond Electronics
Manufacturing StatusActive
Manufacturer Standard Lead Time28 Weeks
Datasheet

Specifications & Environmental

Device Package24-TFBGA (6x8)Memory FormatFLASHTechnologyFLASH - NAND (SLC)
Memory Size512 MbitAccess Time7 nsGradeIndustrial
Clock Frequency166 MHzVoltage2.7V ~ 3.6VMemory TypeNon-Volatile
Operating Temperature-40°C ~ 85°C (TA)Write Cycle Time Word Page700 μsPackaging24-TBGA
Mounting MethodNon-VolatileMemory InterfaceSPI - Quad I/OMemory Organization64M x 8
Moisture Sensitivity Level3 (168 Hours)RoHS ComplianceROHS3 CompliantREACH ComplianceREACH Unaffected
QualificationN/AECCN3A991B1AHTS Code8542.32.0071

Overview of W25N512GVBIT – IC FLASH 512MBIT SPI 24TFBGA

The W25N512GVBIT is a 3V, 512 M-bit serial SLC NAND flash memory device from Winbond's SpiFlash® family. It provides serial Dual/Quad SPI interface with buffer read and continuous read modes and is organized as 64M × 8 bits in a 24-TFBGA (6×8 mm) package.

Designed for non-volatile storage in embedded designs, the device offers clock operation up to 166 MHz, an access time of 7 ns, and a supply voltage range of 2.7 V to 3.6 V. On-chip protection, ECC status reporting and bad block management features support reliable block and page operations.

Key Features

  • Memory Architecture 
    512 Mbit SLC NAND flash organized as 64M × 8 for byte-wide access and large on-board storage capacity.
  • Serial Interface 
    SPI interface with Dual and Quad I/O support for flexible signaling modes and command sets.
  • Read Modes 
    Buffer read and continuous read modes are supported to optimize sequential data access patterns.
  • Performance 
    Supports clock operation up to 166 MHz with an access time of 7 ns for low-latency read transactions.
  • Program/Erase 
    128 KB block erase support and program execute commands; typical word/page write cycle time specified at 700 µs.
  • Protection and Management 
    Includes protection/configuration/status registers (volatile and OTP-lockable options), bad block management, BBM look-up support, and status registers reporting ECC and program/erase failure flags.
  • Voltage and Temperature 
    Supply voltage range 2.7 V to 3.6 V; operating temperature range −40 °C to 85 °C (TA).
  • Package 
    24-TFBGA (6×8 mm) supplier device package providing a compact BGA footprint.

Typical Applications

  • Embedded Systems 
    Non-volatile serial flash storage for embedded devices requiring SLC NAND memory with Dual/Quad SPI access.
  • Firmware and Boot Storage 
    Storage of firmware and boot code using continuous and buffer read modes for sequential code retrieval.
  • Block Storage and Data Logging 
    Large-block erase (128 KB) and bad block management support storage of log or large data blocks with on-chip management features.

Unique Advantages

  • Large SLC Capacity: 512 Mbit organized as 64M × 8 provides substantial non-volatile storage in a single device.
  • Flexible SPI I/O Modes: Dual and Quad SPI support plus buffer/continuous read modes let designers select I/O and read strategies that match system requirements.
  • Defined Performance Parameters: 166 MHz clock frequency and 7 ns access time provide clear, measurable timing characteristics for system integration.
  • On‑Chip Management: Bad block management, BBM lookup, ECC status reporting and configurable protection registers help maintain data integrity and control memory access.
  • Wide Voltage and Temperature Range: 2.7 V–3.6 V supply and −40 °C to 85 °C operating range accommodate a variety of embedded operating environments.
  • Compact BGA Package: 24-TFBGA (6×8 mm) package minimizes board footprint while providing a reliable solder-down mounting option.

Why Choose W25N512GVBIT?

The W25N512GVBIT positions itself as a 3V serial SLC NAND flash device offering substantial storage capacity with Dual/Quad SPI access, structured protection registers, and on-chip memory management features such as bad block handling and ECC status reporting. Its documented timing (166 MHz clock, 7 ns access) and defined program/erase behavior (128 KB block erase, 700 µs write cycle time) make integration and performance budgeting straightforward for hardware and firmware teams.

This device is suited to designs that need a compact, high-capacity serial flash solution in a 24-TFBGA package and require explicit configuration and status controls for reliable non-volatile storage across a −40 °C to 85 °C operating range.

Request a quote or contact sales for pricing, lead-time and additional technical information about the W25N512GVBIT.

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