EPF6010ATC144-3
| Part Description |
FLEX 6000 Field Programmable Gate Array (FPGA) IC 102 880 144-LQFP |
|---|---|
| Quantity | 617 Available (as of May 5, 2026) |
| Product Category | Field Programmable Gate Array (FPGA) |
|---|---|
| Manufacturer | Intel |
| Manufacturing Status | Obsolete |
| Manufacturer Standard Lead Time | RFQ |
| Datasheet |
Specifications & Environmental
| Device Package | 144-TQFP (20x20) | Grade | Commercial | Operating Temperature | 0°C – 85°C | ||
|---|---|---|---|---|---|---|---|
| Package / Case | 144-LQFP | Number of I/O | 102 | Voltage | 3 V - 3.6 V | ||
| Mounting Method | Surface Mount | RoHS Compliance | RoHS non-compliant | REACH Compliance | REACH Unaffected | ||
| Moisture Sensitivity Level | 3 (168 Hours) | Number of LABs/CLBs | 88 | Number of Logic Elements/Cells | 880 | ||
| Number of Gates | 10000 | ECCN | 3A991D | HTS Code | 8542.39.0001 | ||
| Qualification | N/A |
Overview of EPF6010ATC144-3 – FLEX 6000 Field Programmable Gate Array (FPGA) IC 102 880 144-LQFP
The EPF6010ATC144-3 is a FLEX 6000 family FPGA supplied in a 144-pin LQFP/TQFP footprint. Based on the OptiFLEX register-rich, LUT-based architecture, this device is positioned as a low-cost, reconfigurable alternative to gate-array implementations for prototyping, design testing, and moderate-complexity logic integration.
With 880 logic elements (approximately 10,000 typical gates), 102 I/O pins, and support for in-circuit reconfiguration and IEEE 1149.1 JTAG boundary-scan, the EPF6010ATC144-3 targets applications that require flexible logic, configurable I/O control, and straightforward board-level integration within commercial temperature ranges.
Key Features
- Core architecture OptiFLEX, LUT-based, register-rich architecture providing a compact, routable FPGA fabric suitable for replacing low- to mid-density gate-array designs.
- Logic capacity 880 logic elements (typical ≈ 10,000 gates) for implementing combinational and sequential logic.
- I/O and interfacing 102 general-purpose I/O pins with individual tri-state output enable control and programmable output slew-rate to manage signal integrity and interface timing.
- Configuration & test Supports in-circuit reconfigurability via external configuration device or intelligent controller; built-in IEEE 1149.1 JTAG boundary-scan circuitry for board-level test and visibility (note: embedded JTAG logic may add up to 14,000 gates).
- Dedicated arithmetic & logic support Dedicated carry and cascade chains for efficient implementation of adders, counters, comparators and high-fan-in logic structures.
- Clocking & interconnect Built-in low-skew clock distribution with four low-skew global paths and FastTrack continuous routing structure for predictable interconnect delays.
- Memory 0 total RAM bits on-chip (no embedded RAM).
- Power & supply Supply voltage range 3.0 V to 3.6 V; family-level features include low standby current characteristics.
- Package & mounting Surface-mount 144-pin LQFP package (supplier device package listed as 144-TQFP, 20 × 20 mm) for compact board-level integration.
- Operating range & compliance Commercial grade with operating temperature 0 °C to 85 °C; RoHS compliant.
Typical Applications
- Prototyping and design validation Reconfigurable SRAM-based architecture and in-circuit reconfiguration enable rapid iteration during prototype and test cycles.
- Gate-array replacement Low-cost programmable alternative for applications that previously used fixed gate-array logic, enabling late-stage design changes without mask respins.
- I/O bridging and interface logic Multi-voltage I/O support and 102 user I/Os make the device suitable for bridging modules and handling board-level glue logic.
- Arithmetic and control blocks Dedicated carry and cascade chains simplify implementation of adders, counters, and high-fan-in control logic.
Unique Advantages
- Reprogrammable flexibility: SRAM-based device architecture with in-circuit reconfiguration lets designers update functionality without hardware changes.
- Compact, efficient fabric: OptiFLEX architecture reduces die area while retaining routability, helping contain BOM and board space for mid-density logic functions.
- Comprehensive I/O control: Per-pin tri-state enable and programmable slew-rate enable precise control of signal behavior for varied interface requirements.
- Built-in test support: IEEE 1149.1 JTAG boundary-scan is integrated for board-level test access without consuming user logic resources.
- Predictable timing: Low-skew clock distribution and continuous routing structure support deterministic timing for synchronous designs.
- Pin- and footprint-friendly: Available in a 144-pin TQFP/LQFP package for easy integration into compact PCB layouts.
Why Choose EPF6010ATC144-3?
The EPF6010ATC144-3 delivers a balance of reprogrammability, I/O flexibility, and moderate logic density in a compact, commercial-grade package. Its OptiFLEX architecture and dedicated arithmetic resources make it well suited for engineers replacing gate-array designs, iterating prototypes, or consolidating glue logic and control functions on a single device.
This device is a practical choice for design teams seeking a verified, reconfigurable FPGA solution with industry-standard JTAG test support, a broad set of I/O controls, and straightforward integration into 3.3 V designs within commercial temperature ranges.
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