EPF6010ATI100-2
| Part Description |
FLEX 6000 Field Programmable Gate Array (FPGA) IC 71 880 100-TQFP |
|---|---|
| Quantity | 642 Available (as of October 7, 2026) |
| Product Category | Field Programmable Gate Array (FPGA) |
|---|---|
| Manufacturer | Intel |
| Manufacturing Status | Obsolete |
| Manufacturer Standard Lead Time | Contact Us |
| Datasheet |
Specifications & Environmental
| Device Package | 100-TQFP (14x14) | Grade | Industrial | Operating Temperature | -40°C – 100°C | ||
|---|---|---|---|---|---|---|---|
| Package / Case | 100-TQFP | Number of I/O | 71 | Voltage | 3 V - 3.6 V | ||
| Mounting Method | Surface Mount | RoHS Compliance | RoHS non-compliant | REACH Compliance | REACH Unaffected | ||
| Moisture Sensitivity Level | 3 (168 Hours) | Number of LABs/CLBs | 88 | Number of Logic Elements/Cells | 880 | ||
| Number of Gates | 10000 | ECCN | 3A991D | HTS Code | 8542.39.0001 | ||
| Qualification | N/A |
Overview of EPF6010ATI100-2 – FLEX 6000 FPGA, 100‑TQFP, 71 I/O, 880 Logic Elements
The EPF6010ATI100-2 is a FLEX 6000 family field-programmable gate array (FPGA) in a 100‑pin TQFP (14×14 mm) package. Based on the OptiFLEX register-rich, LUT‑based architecture, it provides a low-cost, reprogrammable alternative to fixed gate-array designs for prototyping, design validation, and low- to mid-volume deployments.
With 880 logic elements (LEs), approximately 10,000 typical gates, 71 I/O pins, a 3.0–3.6 V supply range, and industrial operating temperature rating, the device targets embedded control, interface bridging, and in-circuit reconfigurable applications that require robust packaging and wide temperature support.
Key Features
- Core Architecture OptiFLEX LUT-based, register-rich architecture that optimizes device-area efficiency and supports rapid design changes.
- Logic Capacity 880 logic elements and a typical gate-equivalent of 10,000 gates, enabling moderate-density logic integration on a single device.
- I/O and Interface Flexibility 71 I/O pins on the 100‑pin TQFP package with per-pin tri-state control and programmable output slew-rate for signal integrity management.
- Configuration and Test In-circuit reconfigurability (ICR) via external configuration device or intelligent controller, plus built-in IEEE 1149.1 JTAG boundary-scan test (BST) for board-level testability.
- Dedicated Arithmetic and Logic Chains Dedicated carry and cascade chains for high-speed adders, counters, comparators, and high‑fan‑in logic functions to simplify implementation of arithmetic and complex logic.
- Clocking and Routing Built-in low-skew clock distribution and FastTrack continuous routing structure for predictable interconnect delays and efficient timing.
- Power and Voltage Operates from 3.0 V to 3.6 V. Family data show low standby power (typical <0.5 mA in standby mode) and support for hot-socketing in 3.3‑V configurations.
- Package & Mounting 100‑pin TQFP (14×14 mm), surface-mount package suited for compact board layouts; RoHS compliant.
- Environmental and Reliability Industrial grade operation with an extended operating temperature range from −40 °C to 100 °C and 100% functional testing prior to shipment.
Typical Applications
- Prototyping & Design Validation Rapidly iterate logic and system-level designs with in-circuit reconfiguration and reprogrammable LUT-based logic to shorten development cycles.
- Gate Array Replacement Cost-effective alternative to low- and mid-volume gate-array implementations where design changes or updates are expected during production or field service.
- Mixed‑Voltage Interface Bridging Use the device’s flexible I/O features to bridge systems operating at different voltages and manage peripheral interfaces on a single FPGA.
- Embedded Control & Peripheral Management Implement control logic, interface handling, and timing-critical functions using dedicated carry/cascade chains and low-skew clock distribution.
Unique Advantages
- Reprogrammable Flexibility: In-circuit reconfigurability lets you update functionality without board-level replacements, reducing field service complexity.
- Testability Built In: IEEE 1149.1 JTAG boundary-scan support and 100% functional device testing simplify board bring-up and manufacturing diagnostics.
- Predictable Timing: Low-skew global clock paths and FastTrack interconnect improve timing predictability for synchronous designs.
- Arithmetic Acceleration: Dedicated carry and cascade chains streamline implementation of fast adders, counters, and high‑fan‑in logic without consuming extra routing resources.
- Industrial Temperature Range: Specified operation from −40 °C to 100 °C supports deployments in demanding thermal environments.
- Compact, Surface‑Mount Package: 100‑pin TQFP (14×14 mm) offers a compact footprint for space-constrained boards while providing 71 usable I/O pins.
Why Choose EPF6010ATI100-2?
The EPF6010ATI100-2 combines a proven OptiFLEX LUT-based architecture with practical logic density (880 logic elements) and 71 general-purpose I/O pins in a compact 100‑TQFP package. Its family-level features—dedicated arithmetic chains, robust clock distribution, in-circuit reconfigurability, and built-in JTAG—make it suited to teams that need flexible, testable hardware for prototyping, low-volume production, or embedded control tasks.
With a 3.0–3.6 V supply range, RoHS compliance, surface-mount packaging, and industrial temperature rating (−40 °C to 100 °C), the device offers a balance of integration, environmental tolerance, and board-level testability that supports long-term design stability and iterative development.
Request a quote or submit a product inquiry to get pricing and availability for the EPF6010ATI100-2.

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