IS43R16160D-6BL

IC DRAM 256MBIT PAR 60TFBGA
Part Description

IC DRAM 256MBIT PAR 60TFBGA

Quantity 576 Available (as of May 5, 2026)
Product CategoryMemory
ManufacturerIntegrated Silicon Solution Inc
Manufacturing StatusObsolete
Manufacturer Standard Lead TimeRFQ
Datasheet

Specifications & Environmental

Device Package60-TFBGA (8x13)Memory FormatDRAMTechnologySDRAM - DDR
Memory Size256 MbitAccess Time700 psGradeCommercial
Clock Frequency166 MHzVoltage2.3V ~ 2.7VMemory TypeVolatile
Operating Temperature0°C ~ 70°C (TA)Write Cycle Time Word Page15 nsPackaging60-TFBGA
Mounting MethodVolatileMemory InterfaceParallelMemory Organization16M x 16
Moisture Sensitivity Level3 (168 Hours)RoHS ComplianceROHS CompliantREACH ComplianceREACH Unaffected
QualificationN/AECCNEAR99HTS Code8542.32.0024

Overview of IS43R16160D-6BL – IC DRAM 256MBIT PAR 60TFBGA

The IS43R16160D-6BL is a 256 Mbit DDR SDRAM organized as 16M × 16, implemented in a parallel DRAM architecture with double-data-rate operation. The device uses a pipeline architecture with four internal banks and supports SSTL_2 compatible I/O, differential clock inputs, and a data strobe (DQS) for registered data capture.

Designed for systems that require high-speed, parallel DDR memory, the device delivers dual transfers per clock cycle and programmable timing options to match system timing requirements. Key attributes include a 60‑TFBGA (8×13) package, 2.3 V–2.7 V supply range, and an operating temperature range of 0°C to 70°C.

Key Features

  • Core & Architecture  Double-data-rate architecture with pipeline access and four internal banks for concurrent operation, enabling continuous read/write burst accesses.
  • Memory Organization  256 Mbit capacity organized as 16M × 16, providing a parallel 16-bit data interface.
  • Performance  Supports up to 166 MHz clock frequency (device speed grade -6 listed at 167 MHz in timing table); programmable CAS latencies of 2, 2.5 and 3 and burst lengths of 2, 4 and 8.
  • Data Timing & Capture  Bidirectional data strobe (DQS) transmitted/received with data; DQS edge-aligned for READ and centre-aligned for WRITE operations. DLL aligns DQ/DQS with CK transitions.
  • Interface & Commands  Differential clock inputs (CK/CK̄) with commands registered on positive CK edges; data and data mask referenced to both edges of DQS.
  • Refresh & Power Modes  Auto Refresh and Self Refresh modes supported; Auto Precharge and TRAS lockout supported to manage row timing.
  • Timing & Latency  Access time listed as 700 ps and write cycle time (word/page) of 15 ns, enabling tight timing control for burst operations.
  • Power  VDD and VDDQ operation at 2.5 V ±0.2 V (specified supply range 2.3 V–2.7 V); SSTL_2 compatible I/O signaling.
  • Package & Temperature  Available in a 60‑TFBGA (8×13) package; commercial operating temperature range of 0°C to 70°C.

Typical Applications

  • High‑speed memory subsystems  Use where a 256 Mbit DDR SDRAM with burst capability and programmable CAS latency is required for throughput and buffering.
  • Board‑level parallel DDR memory  Suitable for PCB designs that require SSTL_2 compatible I/O and a compact 60‑TFBGA (8×13) package footprint.
  • Systems requiring low-voltage DDR I/O  Ideal for designs constrained to the 2.3 V–2.7 V supply range and commercial temperature operation.

Unique Advantages

  • Double-data-rate transfers: Two data transfers per clock cycle increase data throughput without changing clock frequency.
  • Flexible timing options: Programmable CAS latencies (2 / 2.5 / 3) and selectable burst lengths (2, 4, 8) allow tuning for a variety of system timing requirements.
  • Robust data capture: Bidirectional DQS with DLL alignment and differential clocking improves timing margin for both reads and writes.
  • Concurrent bank operation: Four internal banks support overlapping commands and burst accesses to improve effective memory efficiency.
  • Compact package: 60‑TFBGA (8×13) package provides a small footprint for board-level integration.
  • Standard supply and signaling: 2.5 V ±0.2 V VDD/VDDQ and SSTL_2 I/O compatibility simplify integration with SSTL_2 signaling systems.

Why Choose IC DRAM 256MBIT PAR 60TFBGA?

The IS43R16160D-6BL positions itself as a focused, standards-based DDR SDRAM device for designs that require a 256 Mbit parallel DDR memory with programmable latency, burst control, and SSTL_2 I/O. Its DLL-aligned DQ/DQS, differential clock inputs, and four-bank architecture support predictable burst behavior and concurrent operations.

This device is well suited to engineers specifying board-level DDR memory where a 16‑bit data interface, compact 60‑TFBGA package, and commercial temperature range (0°C to 70°C) meet system requirements. The combination of programmable timing, refresh modes, and supported supply range offers design flexibility for a variety of parallel DDR memory implementations.

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