M12L2561616A-7BG2T
| Part Description |
SDRAM 256Mbit 4M×16×4 Banks, 3.3V, 143MHz, 54-BGA |
|---|---|
| Quantity | 1,833 Available (as of May 5, 2026) |
Specifications & Environmental
| Device Package | BGA | Memory Format | DRAM | Technology | DRAM | ||
|---|---|---|---|---|---|---|---|
| Memory Size | 256 Mbit | Access Time | 5.4 ns | Grade | Commercial | ||
| Clock Frequency | 143 MHz | Voltage | 3.0V ~ 3.6V | Memory Type | Volatile | ||
| Operating Temperature | 0°C – 70°C | Write Cycle Time Word Page | 14 ns | Packaging | 54-BGA | ||
| Mounting Method | Surface Mount | Memory Interface | Parallel | Memory Organization | 4M x 16 | ||
| Moisture Sensitivity Level | 3 | RoHS Compliance | Compliant | REACH Compliance | REACH Unknown | ||
| Qualification | JEDEC | ECCN | EAR99 | HTS Code | 8542.32.00.24 |
Overview of M12L2561616A-7BG2T – SDRAM 256Mbit 4M×16×4 Banks, 3.3V, 143MHz, 54-BGA
The M12L2561616A-7BG2T from ESMT is a synchronous high-data-rate DRAM organized as 4 × 4,194,304 words by 16 bits (268,435,456 bits). It implements a four-bank architecture and synchronous operation to support precise cycle control driven by the system clock.
Designed for commercial-grade memory system integration, this device targets high-bandwidth, high-performance memory applications that require programmable burst and latency options, JEDEC-standard 3.3V operation, and a compact 54-ball BGA package.
Key Features
- Memory Organization & Density — 268,435,456-bit density arranged as 4M × 16 with four internal banks for concurrent bank operation and data throughput management.
- Performance — Supports 143 MHz system clock with an access time of 5.4 ns and a write cycle time (word/page) of 14 ns.
- Synchronous DRAM Controls — JEDEC-standard synchronous DRAM with CAS latency options of 2 and 3, programmable burst lengths (1, 2, 4, 8 & full page), and burst types (sequential & interleave); all inputs sampled on the positive edge of CLK.
- Power & Voltage — JEDEC standard 3.3V supply with an operating voltage range of 3.0V to 3.6V; supports auto and self-refresh and a 64 ms refresh period (8K cycles).
- Interface & Control Signals — Parallel memory interface with standard control pins (CLK, CS, CKE, RAS, CAS, WE, BA0/1, A0–A12) and DQM for data masking.
- Package & Mounting — 54-ball BGA surface-mount package (BGA54, 8 mm × 8 mm × 1 mm body, 0.8 mm ball pitch) for compact board-level integration.
- Compliance & Grade — JEDEC-qualified device, Pb-free and RoHS-compliant; commercial grade with an operating temperature range of 0 °C to 70 °C.
Typical Applications
- High-bandwidth memory systems — Designed for use in high-performance memory subsystems where synchronous DRAM with programmable burst and latency is required.
- Commercial electronic systems — Suited to commercial-grade designs operating within 0 °C to 70 °C and using a 3.3V supply range.
- Compact board-level memory integration — 54-BGA package supports space-constrained PCB layouts requiring surface-mount memory devices.
Unique Advantages
- Flexible timing and burst modes — CAS latency selectable between 2 and 3 with multiple burst length and type options to match system throughput and latency requirements.
- Four-bank architecture — Internal bank structure enables interleaved operation and improved effective throughput for sequential and random accesses.
- JEDEC-standard power and refresh — 3.3V JEDEC standard supply with auto/self-refresh and standard 64 ms refresh period simplifies system memory management.
- Compact BGA footprint — 54-ball BGA (8 mm × 8 mm, 0.8 mm pitch) minimizes board area for dense system designs.
- Standards and environmental compliance — JEDEC-qualified and RoHS-compliant Pb-free construction aligns with industry manufacturing and environmental requirements.
- Parallel interface with standard controls — Standard control signals (CLK, CS, CKE, RAS, CAS, WE, BA, A0–A12) and DQM support integration with common memory controllers.
Why Choose M12L2561616A-7BG2T?
The M12L2561616A-7BG2T offers a balanced combination of density, synchronous operation, and flexible timing options in a compact BGA package. JEDEC qualification and standard 3.3V operation make it suitable for designers building high-bandwidth, commercial memory systems that require programmable burst and latency behavior.
With four internal banks, DQM data masking, and support for auto/self-refresh, this device provides the control features needed to integrate reliable synchronous DRAM into system designs while maintaining a small board footprint and industry-standard compliance.
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Date Founded: 1998
Headquarters: Hsinchu Science Park, Hsinchu, Taiwan
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