M15T2G16128A-BDBG2R
| Part Description |
DDR3L SDRAM 2Gb 128Mbx16 800MHz 96 Ball BGA |
|---|---|
| Quantity | 1,784 Available (as of May 5, 2026) |
Specifications & Environmental
| Device Package | 96 Ball BGA | Memory Format | DRAM | Technology | DDR3L | ||
|---|---|---|---|---|---|---|---|
| Memory Size | 2 Gbit | Access Time | 13.75 ns | Grade | Automotive | ||
| Clock Frequency | 800 MHz | Voltage | 1.35V, 1.5V | Memory Type | Volatile | ||
| Operating Temperature | -40°C – 105°C | Write Cycle Time Word Page | 15 ns | Packaging | 96 Ball BGA | ||
| Mounting Method | Surface Mount | Memory Interface | Parallel | Memory Organization | 128M x 16 | ||
| Moisture Sensitivity Level | 3 | RoHS Compliance | Compliant | REACH Compliance | REACH Unknown | ||
| Qualification | JEDEC | ECCN | EAR99 | HTS Code | 8542.32.00.36 |
Overview of M15T2G16128A-BDBG2R – DDR3L SDRAM 2Gb 128Mbx16 800MHz 96 Ball BGA
The M15T2G16128A-BDBG2R is a 2.147 Gbit DDR3(L) SDRAM organized as 128M × 16 with an 8-bank architecture and 8n prefetch. This device implements double-data-rate transfer, differential clock and data-strobe signaling, and supports DDR3(L)-1600 timing at an effective 800 MHz clock.
Designed for systems that require synchronous high-speed DRAM with flexible voltage operation, the device supports both 1.35 V and 1.5 V supplies and includes signal-integrity and power-saving features for reliable memory operation across a wide operating temperature range.
Key Features
- Memory Organization: 2.147 Gbit capacity arranged as 128M × 16 with 8 banks, providing standard DDR3(L) density and access structure.
- Performance: Supports an 800 MHz clock (DDR3(L)-1600, listed for 11-11-11 timing), with documented access time of 13.75 ns and a write cycle time (word page) of 15 ns.
- Dual Voltage Operation: SSTL_135 and SSTL_15 compatible with VDD/VDDQ = 1.35 V (−0.067 V/+0.1 V) or 1.5 V (±0.075 V), enabling system-level voltage flexibility.
- JEDEC DDR3(L) Compliant: Implements JEDEC-defined DDR3(L) features and timing options to match standard system controllers and memory interfaces.
- Signal and Timing Controls: Differential clock (CK/CK) and differential DQS/DQS, configurable drive-strength (DS), on-die termination (ODT) options, and ZQ calibration for impedance accuracy.
- Data Integrity and Power Modes: Auto Refresh, Self Refresh, Power Down, Partial Array Self Refresh (PASR), and programmable refresh/timing parameters to balance performance and power.
- Read/Write Leveling and Programmability: Supports write leveling (via MR settings) and read leveling (via MPR) plus a range of CAS latencies and programmable burst lengths to match system timing requirements.
- Package and Mounting: 96-ball BGA surface-mount package for compact board-level integration and high-density assembly.
- Temperature Range: Specified operating temperature from −40 °C to 105 °C for use in thermally demanding environments.
- Compliance and Environmental: JEDEC qualification and RoHS compliant.
Typical Applications
- General high-speed memory applications: For systems requiring synchronous DDR3(L) operation and up to DDR3-1600 effective data rates.
- Voltage-flexible designs: Suited to designs that need operation at either 1.35 V or 1.5 V supply rails.
- Compact, board-level memory implementations: 96-ball BGA package enables high-density mounting where board space is constrained.
- Thermally demanding environments: Applications that require operation across a wide temperature range (−40 °C to 105 °C).
Unique Advantages
- Dual-voltage compatibility: Supports both 1.35 V and 1.5 V supplies, allowing the same device to be used in systems with different power domains.
- Flexible timing options: Programmable CAS latencies, write recovery, and burst-length settings enable tuning for system performance and latency requirements.
- Signal integrity controls: Configurable drive strength, multiple ODT settings, and ZQ calibration help maintain signal and impedance accuracy in high-speed designs.
- Power management features: Multiple refresh and power-down modes (including PASR and self-refresh) provide options to reduce power consumption when full performance is not required.
- Compact BGA package: 96-ball BGA allows high-density board designs while maintaining standard DRAM footprint practices.
- Standards-based interoperability: JEDEC DDR3(L) compliance supports integration with standard memory controllers and system designs.
Why Choose M15T2G16128A-BDBG2R?
The M15T2G16128A-BDBG2R delivers a standards-based DDR3(L) memory building block with flexible voltage operation, programmable timing, and a comprehensive set of signal-integrity and power-management features. Its 128M × 16 organization, 8-bank architecture, and 96-ball BGA package make it appropriate for designs that require conventional DDR3(L) density and board-level integration.
With JEDEC compliance, configurable termination and drive strength, and operational support across −40 °C to 105 °C, this device is suited to engineers looking for a predictable, programmable DDR3(L) DRAM solution that can be tailored to system timing and power requirements.
Request a quote or submit a materials request to evaluate the M15T2G16128A-BDBG2R for your next design. Our team can provide pricing, availability, and technical documentation to support qualification and integration.
Date Founded: 1998
Headquarters: Hsinchu Science Park, Hsinchu, Taiwan
Employees: 400+
Revenue: $377.8 Million
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