MT29F32G08AECBBH1-12:B
| Part Description |
IC FLASH 32GBIT PARALLEL 100VBGA |
|---|---|
| Quantity | 35 Available (as of May 5, 2026) |
| Product Category | Memory |
|---|---|
| Manufacturer | Micron Technology Inc. |
| Manufacturing Status | Obsolete |
| Manufacturer Standard Lead Time | RFQ |
| Datasheet |
Specifications & Environmental
| Device Package | 100-VBGA (12x18) | Memory Format | FLASH | Technology | FLASH - NAND | ||
|---|---|---|---|---|---|---|---|
| Memory Size | 32 Gbit | Access Time | N/A | Grade | Commercial | ||
| Clock Frequency | 83 MHz | Voltage | 2.7V ~ 3.6V | Memory Type | Non-Volatile | ||
| Operating Temperature | 0°C ~ 70°C (TA) | Write Cycle Time Word Page | N/A | Packaging | 100-VBGA | ||
| Mounting Method | Non-Volatile | Memory Interface | Parallel | Memory Organization | 4G x 8 | ||
| Moisture Sensitivity Level | 3 (168 Hours) | RoHS Compliance | ROHS3 Compliant | REACH Compliance | REACH Unknown | ||
| Qualification | N/A | ECCN | 3A991B1A | HTS Code | 8542.32.0071 |
Overview of MT29F32G08AECBBH1-12:B – IC FLASH 32GBIT PARALLEL 100VBGA
The MT29F32G08AECBBH1-12:B is a 32 Gbit non-volatile NAND flash memory in a 100-ball VBGA (12×18) package. It implements NAND flash architecture with a 4G × 8 memory organization and supports parallel interface operation for embedded storage applications.
This device combines high-density NAND storage with a broad operating voltage range (2.7 V–3.6 V) and a commercial operating temperature range (0°C to +70°C), making it suitable for designs that require compact, on-board non-volatile memory in space-constrained packages.
Key Features
- Memory Type & Density — 32 Gbit NAND flash organized as 4G × 8, providing high-density non-volatile storage in a single device.
- Package — 100-VBGA (12×18) package offers a compact BGA footprint for space-constrained board layouts.
- Interface — Parallel memory interface with support for both asynchronous and synchronous I/O modes; ONFI 2.2-compliant signaling is included in the product family.
- Performance — Synchronous I/O performance up to timing mode 5 with read/write throughput per pin up to 200 MT/s (synchronous) and up to 50 MT/s (asynchronous); product-level clock frequency listed at 83 MHz.
- Memory Organization & Block Structure — Page size (x8) 8,640 bytes (8,192 + 448), block size 128 pages (1,024K + 56K bytes); device contains 4,096 blocks for the 32Gb density.
- Advanced Command Set — Supports program cache, read cache (sequential and random), OTP mode, multi-plane commands, multi-LUN operations, read unique ID, and copyback operations.
- Power — Operating voltage range VCC: 2.7–3.6 V (VCCQ supported ranges noted in datasheet).
- Reliability & Endurance — Endurance specified at 80,000 program/erase cycles and data retention consistent with JESD47G requirements as noted in the datasheet.
- Operating Temperature — Commercial grade operation from 0°C to +70°C (TA).
Typical Applications
- Embedded Storage — On-board non-volatile storage for embedded controllers and systems requiring 32 Gbit of NAND capacity in a compact package.
- Firmware & System Images — Storage of firmware, boot loaders, and system images where program/erase endurance and data retention are important.
- Data Logging — Local non-volatile data capture where a parallel NAND interface and the device’s capacity meet system needs.
Unique Advantages
- High-density in a compact BGA — 32 Gbit capacity in a 100-ball VBGA (12×18) package reduces board area compared with multi-device solutions.
- Flexible I/O modes — Support for asynchronous and synchronous operation (ONFI 2.2 family features) enables designers to choose performance and timing appropriate to system requirements.
- Advanced NAND features — Program/read caches, multi-plane and multi-LUN commands, OTP mode, and copyback capability simplify high-throughput and advanced memory management strategies.
- Industry-standard voltage range — 2.7 V–3.6 V supply compatibility fits common system power rails for straightforward integration.
- Documented endurance and retention — Endurance (80,000 P/E cycles) and JESD47G-aligned retention statements provide measurable reliability characteristics for design validation.
Why Choose MT29F32G08AECBBH1-12:B?
The MT29F32G08AECBBH1-12:B positions itself as a high-density, feature-rich parallel NAND flash device suitable for designs that require compact non-volatile storage with documented endurance and advanced NAND command capabilities. Its 100-VBGA package and 32 Gbit capacity help reduce board complexity while enabling standard-voltage operation.
This part is appropriate for engineers specifying on-board NAND for embedded systems, firmware storage, or data-logging applications that benefit from flexible I/O modes, advanced cache and multi-plane operations, and clearly stated endurance and retention characteristics.
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