MT29F32G08AECCBH1-10:C
| Part Description |
IC FLASH 32GBIT PARALLEL 100VBGA |
|---|---|
| Quantity | 935 Available (as of May 5, 2026) |
| Product Category | Memory |
|---|---|
| Manufacturer | Micron Technology Inc. |
| Manufacturing Status | Obsolete |
| Manufacturer Standard Lead Time | RFQ |
| Datasheet |
Specifications & Environmental
| Device Package | 100-VBGA (12x18) | Memory Format | FLASH | Technology | FLASH - NAND | ||
|---|---|---|---|---|---|---|---|
| Memory Size | 32 Gbit | Access Time | N/A | Grade | Commercial | ||
| Clock Frequency | 100 MHz | Voltage | 2.7V ~ 3.6V | Memory Type | Non-Volatile | ||
| Operating Temperature | 0°C ~ 70°C (TA) | Write Cycle Time Word Page | N/A | Packaging | 100-VBGA | ||
| Mounting Method | Non-Volatile | Memory Interface | Parallel | Memory Organization | 4G x 8 | ||
| Moisture Sensitivity Level | 3 (168 Hours) | RoHS Compliance | ROHS3 Compliant | REACH Compliance | REACH Unknown | ||
| Qualification | N/A | ECCN | 3A991B1A | HTS Code | 8542.32.0071 |
Overview of MT29F32G08AECCBH1-10:C – IC FLASH 32GBIT PARALLEL 100VBGA
The MT29F32G08AECCBH1-10:C is a 32 Gbit non-volatile NAND flash memory device in a 100-ball VBGA (12×18) package. It implements single-level cell (SLC) NAND architecture with a 4G × 8 memory organization and a parallel memory interface optimized for commercial embedded storage applications.
Designed for systems requiring moderate capacity, durable program/erase endurance, and flexible I/O timing, this device offers both asynchronous and synchronous operation modes, a wide operating voltage range, and a commercial operating temperature rating for mainstream consumer and industrial-grade designs.
Key Features
- Memory Type & Architecture Single-level cell (SLC) NAND flash with a 4G × 8 organization providing 32 Gbit of non-volatile storage.
- Capacity & Geometry 32 Gbit device size with 4,096 blocks (device-specific block count) and a page size of 8,192 bytes user data plus 448 bytes spare per page as documented in the family datasheet.
- Interface & Standards Parallel memory interface supporting ONFI 2.2-compliant operation for standardized command and timing behavior in both asynchronous and synchronous modes.
- Performance Modes Synchronous I/O (up to synchronous timing mode 5) and asynchronous I/O (up to mode 5). Synchronous throughput up to 200 MT/s per pin; asynchronous throughput up to 50 MT/s per pin (datasheet values).
- Timing & Data Rates Device supports clocked operation (example clock reference 100 MHz) and data strobe (DQS) signals for synchronous data alignment.
- Program/Erase/Read Latencies Typical array performance figures from the family datasheet include read page ~35 μs (max), program page ~350 μs (typical), and erase block ~1.5 ms (typical).
- Endurance & Data Retention Endurance specified at 80,000 program/erase cycles (family datasheet) with data retention and qualification references per JESD47G in the documentation.
- Supply Voltage Options VCC operating range 2.7–3.6 V; VCCQ support options include 1.7–1.95 V or 2.7–3.6 V, enabling flexible I/O voltage configurations.
- Package & Temperature 100-ball VBGA (12×18) package and commercial operating temperature 0°C to +70°C (TA) as specified for this part number.
- Advanced Command Set Supports ONFI command set features such as program cache, read cache (sequential and random), multi-plane and multi-LUN operations, OTP mode, read unique ID, and copyback operations (per datasheet).
- Factory State & ECC First block (block address 00h) is valid when shipped from factory; minimum required ECC guidance is provided in the device error management documentation.
Typical Applications
- Embedded Storage (Consumer Devices) Provides non-volatile mass storage for firmware, applications, and user data in consumer electronics that require a 32 Gbit SLC NAND device.
- Commercial Embedded Systems Suited for commercial-grade embedded controllers and appliances that need reliable program/erase endurance and parallel NAND connectivity.
- Boot and Firmware Storage Used for boot code and firmware images where robust erase/program cycles and defined first-block factory state are important for system bring-up.
Unique Advantages
- Proven SLC NAND Architecture: Single-level cell technology provides higher endurance characteristics (80,000 P/E cycles) compared with multi-level options, supporting longer device life for write-intensive workloads.
- Flexible I/O Timing: Support for both asynchronous and synchronous modes (ONFI 2.2) and data strobe (DQS) enables designers to balance throughput and system timing requirements.
- Wide Voltage Support: VCC 2.7–3.6 V and VCCQ options allow integration into systems with different I/O voltage domains without changing device family.
- Compact BGA Package: 100-ball VBGA (12×18) package provides a small footprint for space-constrained PCBs while delivering a full 32 Gbit capacity.
- Documented Operational Metrics: Datasheet-provided read, program, and erase timing figures allow predictable performance budgeting in system designs.
Why Choose IC FLASH 32GBIT PARALLEL 100VBGA?
The MT29F32G08AECCBH1-10:C is positioned for designs that require a 32 Gbit SLC NAND solution with parallel interface flexibility, clear performance metrics, and strong endurance characteristics. Its ONFI-compliant command set and synchronous/asynchronous operation modes make it suitable for systems that must balance throughput, timing, and integration constraints.
This part is appropriate for engineers specifying commercial-grade embedded storage where predictable read/program/erase behavior, compact 100-ball VBGA packaging, and documented electrical/timing parameters are required. The device’s endurance and documented error management guidance support longer-term reliability planning in product lifecycles.
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