MT29F32G08CBACAL73A3WC1L

IC FLASH 32GBIT PARALLEL DIE
Part Description

IC FLASH 32GBIT PARALLEL DIE

Quantity 511 Available (as of May 5, 2026)
Product CategoryMemory
ManufacturerMicron Technology Inc.
Manufacturing StatusActive
Manufacturer Standard Lead Time13 Weeks
Datasheet

Specifications & Environmental

Device PackageDieMemory FormatFLASHTechnologyFLASH - NAND (MLC)
Memory Size32 GbitAccess Time20 nsGradeCommercial
Clock FrequencyN/AVoltage2.7V ~ 3.6VMemory TypeNon-Volatile
Operating Temperature0°C ~ 70°C (TA)Write Cycle Time Word Page20 nsPackagingDie
Mounting MethodNon-VolatileMemory InterfaceParallelMemory Organization4G x 8
Moisture Sensitivity Level3 (168 Hours)RoHS ComplianceROHS3 CompliantREACH ComplianceREACH Unaffected
QualificationN/AECCNN/AHTS CodeN/A

Overview of MT29F32G08CBACAL73A3WC1L – IC FLASH 32GBIT PARALLEL DIE

The MT29F32G08CBACAL73A3WC1L is a 32 Gbit parallel NAND flash memory die using multi-level cell (MLC) technology. It provides a 4G × 8 memory organization with parallel interface access for integration into die-level assemblies and custom packages.

Designed for non-volatile data storage, the device offers 20 ns access and write-cycle timing characteristics and operates from a 2.7 V to 3.6 V supply within an ambient temperature range of 0°C to 70°C.

Key Features

  • Memory Core and Format MLC NAND flash memory with a 4G × 8 organization and a total capacity of 32 Gbit, provided as a raw die.
  • Interface Parallel memory interface for direct parallel data transfers and integration into parallel NAND architectures.
  • Performance Access time of 20 ns and a write-cycle time (word/page) of 20 ns, supporting timely read and program operations.
  • Power Operates from a single supply range of 2.7 V to 3.6 V, enabling use in systems with common flash voltage rails.
  • Package and Mounting Supplied as a die for direct integration into custom packages or module-level assemblies.
  • Operating Temperature Specified ambient operating range of 0°C to 70°C (TA).

Typical Applications

  • Embedded Storage — Provides non-volatile parallel NAND storage for embedded systems requiring 32 Gbit density in die form.
  • Module and Package Integration — Intended for use in custom module builds where a raw die is bonded into a target package or system-in-package solution.
  • Data Retention and Program Storage — Suited for designs that implement program code or data storage using parallel NAND flash with MLC technology.

Unique Advantages

  • High Density in Die Form: 32 Gbit capacity offered as a raw die enables compact, high-capacity integration into custom assemblies.
  • Parallel Interface Throughput: Parallel memory organization (4G × 8) supports direct parallel data access for compatible controller architectures.
  • Fast Access and Write Timing: 20 ns access and write-cycle timing support responsive program and read operations where timing is a design consideration.
  • Flexible Power Range: 2.7 V to 3.6 V supply compatibility allows use across common flash voltage domains.
  • Die-Level Integration: Supplied as a die to enable custom packaging, direct bonding, or system-in-package implementations.

Why Choose MT29F32G08CBACAL73A3WC1L?

The MT29F32G08CBACAL73A3WC1L positions itself as a high-density MLC NAND flash die for designs that require 32 Gbit of non-volatile parallel storage with 20 ns access and write timing. Its die form factor and parallel interface make it suitable for custom package integration and module-level solutions where component-level control is required.

Manufactured by Micron Technology Inc., this component is appropriate for engineering teams and OEMs seeking a raw NAND flash die with defined voltage and temperature specifications for long-term integration into specialized assemblies.

Request a quote or contact sales to discuss availability, pricing, and integration details for the MT29F32G08CBACAL73A3WC1L.

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