MT29F32G08CBADAL83A3WC1-M

IC FLASH 32GBIT PARALLEL DIE
Part Description

IC FLASH 32GBIT PARALLEL DIE

Quantity 652 Available (as of May 5, 2026)
Product CategoryMemory
ManufacturerMicron Technology Inc.
Manufacturing StatusObsolete
Manufacturer Standard Lead TimeRFQ
Datasheet

Specifications & Environmental

Device PackageDieMemory FormatFLASHTechnologyFLASH - NAND
Memory Size32 GbitAccess TimeN/AGradeCommercial
Clock FrequencyN/AVoltage2.7V ~ 3.6VMemory TypeNon-Volatile
Operating Temperature0°C ~ 70°C (TA)Write Cycle Time Word PageN/APackagingDie
Mounting MethodNon-VolatileMemory InterfaceParallelMemory Organization4G x 8
Moisture Sensitivity LevelN/ARoHS ComplianceUnknownREACH ComplianceREACH Unknown
QualificationN/AECCN3A991B1AHTS Code8542.32.0071

Overview of MT29F32G08CBADAL83A3WC1-M – IC FLASH 32GBIT PARALLEL DIE

The MT29F32G08CBADAL83A3WC1-M is a 32 Gbit non-volatile NAND flash memory provided in a die form factor. It implements a parallel memory interface and is organized as 4G × 8 to deliver high-density storage in a die package.

This device is suited for designs that require parallel NAND flash storage with supply operation between 2.7 V and 3.6 V and an ambient operating temperature range of 0°C to 70°C.

Key Features

  • Memory Type Non-volatile NAND flash memory providing persistent data storage.
  • Density & Organization 32 Gbit capacity organized as 4G × 8 to support high-density storage requirements.
  • Interface Parallel memory interface for die-level integration into systems requiring parallel NAND access.
  • Voltage Supply Operates from 2.7 V to 3.6 V, enabling use with common 3 V system power rails.
  • Package Supplied as a die for direct integration into custom packages, modules, or multi-die assemblies.
  • Operating Temperature Specified ambient temperature range of 0°C to 70°C (TA).
  • Manufacturer Produced by Micron Technology Inc.

Typical Applications

  • Embedded storage — Provides non-volatile parallel NAND memory capacity for embedded systems that require die-level flash integration.
  • Firmware and code storage — Suitable for storing firmware or boot code where parallel NAND architecture is required.
  • Custom modules and multi-die assemblies — Die form factor enables incorporation into custom package designs and module-level integration.

Unique Advantages

  • High-density storage: 32 Gbit capacity addresses applications needing substantial non-volatile memory in a single die.
  • Parallel interface: Parallel memory architecture supports designs that use parallel NAND access methods.
  • Die-level integration: Die package enables direct integration into custom assemblies and compact module designs, reducing the need for separate packaged components.
  • Flexible power range: 2.7 V to 3.6 V operation aligns with standard 3 V system power rails.
  • Commercial temperature rating: 0°C to 70°C ambient range for typical commercial operating environments.

Why Choose MT29F32G08CBADAL83A3WC1-M?

The MT29F32G08CBADAL83A3WC1-M positions itself as a high-density parallel NAND flash die for designs that require persistent storage in a die form factor. Its 32 Gbit capacity, 4G × 8 organization, and parallel interface make it appropriate where die-level integration and parallel access are design drivers.

Manufactured by Micron Technology Inc., this device provides a straightforward specification set—capacity, interface, supply voltage, and operating temperature—for engineers and procurement teams evaluating parallel NAND die solutions for their projects.

Request a quote or submit an inquiry to obtain pricing and availability for MT29F32G08CBADAL83A3WC1-M.

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