MT47H32M16NF-25E:H TR

IC DRAM 512MBIT PARALLEL 84FBGA
Part Description

IC DRAM 512MBIT PARALLEL 84FBGA

Quantity 860 Available (as of May 5, 2026)
Product CategoryMemory
ManufacturerMicron Technology Inc.
Manufacturing StatusActive
Manufacturer Standard Lead Time2 Weeks
Datasheet

Specifications & Environmental

Device Package84-FBGA (8x12.5)Memory FormatDRAMTechnologySDRAM - DDR2
Memory Size512 MbitAccess Time400 psGradeAutomotive
Clock Frequency400 MHzVoltage1.7V ~ 1.9VMemory TypeVolatile
Operating Temperature0°C ~ 85°C (TC)Write Cycle Time Word Page15 nsPackaging84-TFBGA
Mounting MethodVolatileMemory InterfaceParallelMemory Organization32M x 16
Moisture Sensitivity Level3 (168 Hours)RoHS ComplianceROHS3 CompliantREACH ComplianceREACH Unaffected
QualificationAEC-Q100ECCNEAR99HTS Code8542.32.0028

Overview of MT47H32M16NF-25E:H TR – IC DRAM 512MBIT PARALLEL 84FBGA

The MT47H32M16NF-25E:H TR is a 512 Mbit DDR2 SDRAM organized as 32M × 16 with a parallel memory interface in an 84-ball FBGA package. It delivers DDR2-class memory architecture with a 4n-bit prefetch design, targeting embedded and automotive electronic modules that require compact, qualified DRAM for system memory and buffering.

With a 1.7 V–1.9 V supply range, 400 MHz clock capability, and AEC‑Q100 qualification, this device is offered for designs requiring automotive-grade qualification and DDR2 performance in a small 8 mm × 12.5 mm FBGA footprint.

Key Features

  • Memory Architecture  512 Mbit DDR2 SDRAM organized as 32M × 16 with 4 internal banks and a 4n-bit prefetch architecture for DDR2 operation.
  • Performance  Supports a 400 MHz clock rate and an access time of 400 ps with selectable burst lengths (4 or 8) and programmable CAS latency.
  • Timing  Write cycle time (word page) of 15 ns and JEDEC-standard timing options including programmable CAS and additive latency.
  • Power  Operates from a 1.7 V to 1.9 V supply (VDD and VDDQ), providing standard DDR2 1.8 V I/O compatibility.
  • Interface  Parallel memory interface with differential data strobe (DQS/DQS#) options and DLL to align DQ/DQS with CK.
  • Package  84-ball thin FBGA (8 mm × 12.5 mm) package suitable for compact board designs and high-density routing.
  • Operating Range & Qualification  Commercial operating temperature range of 0 °C to +85 °C (TC) and AEC‑Q100 qualification for automotive-grade applications.
  • System Reliability  On-die termination (ODT), selectable data-output drive strength and support for standard refresh cycles (8192-cycle refresh) to maintain signal integrity and data retention.

Typical Applications

  • Automotive Electronic Modules  Memory and buffering for control units and infotainment subsystems where AEC‑Q100 qualification is required.
  • Embedded Systems  System memory and high-speed data buffering for compact embedded boards using a parallel DDR2 interface.
  • Consumer and Industrial Equipment  Low-voltage DDR2 memory for devices needing a small FBGA footprint and standard 1.8 V I/O compatibility.

Unique Advantages

  • AEC‑Q100 Qualified: Provides automotive-grade qualification for use in vehicle electronic systems that require recognized component reliability.
  • DDR2 Performance at 400 MHz: Enables high-throughput parallel memory operations with programmable latency and selectable burst lengths for flexible memory timing.
  • Compact FBGA Package: 84-ball FBGA (8 mm × 12.5 mm) offers a small PCB footprint for space-constrained designs while supporting high-density routing.
  • Flexible Voltage Range: 1.7 V–1.9 V supply supports standard DDR2 1.8 V I/O signaling for compatibility with common DDR2 system designs.
  • Signal Integrity Features: On-die termination and DLL alignment of DQ/DQS improve timing margins and data eye performance in high-speed designs.
  • Industry-Standard DDR2 Options: Programmable CAS, additive latency and selectable burst lengths enable tailoring of memory timing to application requirements.

Why Choose MT47H32M16NF-25E:H TR?

The MT47H32M16NF-25E:H TR combines DDR2 SDRAM architecture, an 84-ball FBGA package, and automotive AEC‑Q100 qualification to provide a compact, qualified memory building block for embedded and vehicle electronics. Its 512 Mbit capacity (32M × 16), 400 MHz clock capability, and configurable timing options make it suitable for designs that require standardized DDR2 performance with automotive-grade reliability.

This device is suited for engineers specifying reliable, low-voltage DDR2 memory in space-constrained PCBs and in applications where component qualification and consistent timing behavior are important for system integration and lifecycle support.

Request a quote or contact sales to discuss availability, pricing, and volume options for the MT47H32M16NF-25E:H TR.

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