MT47H32M8BP-5E:B

IC DRAM 256MBIT PARALLEL 60FBGA
Part Description

IC DRAM 256MBIT PARALLEL 60FBGA

Quantity 890 Available (as of May 5, 2026)
Product CategoryMemory
ManufacturerMicron Technology Inc.
Manufacturing StatusObsolete
Manufacturer Standard Lead TimeRFQ
Datasheet

Specifications & Environmental

Device Package60-FBGA (8x12)Memory FormatDRAMTechnologySDRAM - DDR2
Memory Size256 MbitAccess Time600 psGradeCommercial (Extended)
Clock Frequency200 MHzVoltage1.7V ~ 1.9VMemory TypeVolatile
Operating Temperature0°C ~ 85°C (TC)Write Cycle Time Word Page15 nsPackaging60-FBGA
Mounting MethodVolatileMemory InterfaceParallelMemory Organization32M x 8
Moisture Sensitivity Level2 (1 Year)RoHS ComplianceROHS3 CompliantREACH ComplianceREACH Unaffected
QualificationN/AECCNEAR99HTS Code8542.32.0024

Overview of MT47H32M8BP-5E:B – IC DRAM 256MBIT PARALLEL 60FBGA

The MT47H32M8BP-5E:B is a 256Mbit DDR2 SDRAM organized as 32M × 8 with a parallel memory interface in a 60-ball FBGA (8×12) package. It implements a DDR2 SDRAM architecture with 4 internal banks and a 4n-bit prefetch, delivering DDR2-400 performance with a 200 MHz clock (400 MT/s data rate).

This device targets designs that require compact, low-voltage DDR2 DRAM for embedded memory subsystems operating in commercial temperature ranges (0°C to 85°C), offering programmable latency, selectable burst lengths and on-die termination for system-level timing and signal integrity control.

Key Features

  • DDR2 SDRAM Core 4n-bit prefetch architecture with 4 internal banks for concurrent operation and programmable CAS latency (CL) and additive latency (AL).
  • Memory Organization & Capacity 32M × 8 organization providing 256 Mbit total capacity in a parallel DRAM format.
  • Performance & Timing Rated for DDR2-400 operation (200 MHz clock, 400 MT/s), example timing for the -5E grade includes a 5.0 ns cycle time; write cycle time (word page) specified at 15 ns and access time at 600 ps.
  • Power VDD and VDDQ operate at +1.8 V ±0.1 V (specified supply range 1.7 V to 1.9 V) with JEDEC-standard 1.8 V I/O (SSTL_18-compatible).
  • Signal & I/O Options Differential data strobe (DQS/DQS#) option and duplicate output strobe (RDQS) option for x8 devices to aid data capture and timing alignment; DLL aligns DQ and DQS transitions with CK.
  • System Reliability & Signal Integrity On-die termination (ODT) and support for JEDEC clock jitter specifications to assist system-level signal integrity and timing margins.
  • Burst & Refresh Selectable burst lengths of 4 or 8 and standard 64 ms, 8,192-cycle refresh for data retention management.
  • Package & Mechanical 60-ball FBGA (8 mm × 12 mm) package (60-FBGA (8×12)) for compact board real estate and surface-mount assembly.
  • Temperature Range Commercial operating temperature range of 0°C to 85°C (TC).
  • Compliance Datasheet indicates RoHS compliance and JEDEC-standard I/O compatibility.

Typical Applications

  • Embedded Memory Subsystems Use as onboard DDR2 storage in embedded platforms that require a compact 256 Mbit memory element in a 60-FBGA footprint.
  • Consumer and Industrial Electronics Integration where commercial temperature operation (0°C to 85°C) and DDR2-400 performance are required for system buffering and working memory.
  • Timing-Critical Data Buffers Applications that benefit from programmable CAS latency, selectable burst lengths, and on-die termination to manage read/write timing and signal integrity.

Unique Advantages

  • Standard DDR2 Interface: JEDEC-standard 1.8 V I/O and DDR2 signaling simplify integration with existing DDR2 memory controllers.
  • Compact FBGA Package: 60-ball FBGA (8×12) enables high-density board designs while maintaining a surface-mount form factor.
  • Flexible Timing Control: Programmable CAS and additive latency plus selectable burst lengths allow designers to tune performance for specific system requirements.
  • Signal Integrity Features: On-die termination, differential DQS options and DLL alignment reduce external termination needs and assist high-speed timing alignment.
  • Low-Voltage Operation: 1.8 V VDD/VDDQ operation (1.7 V–1.9 V specified) supports lower-power system designs compared to legacy higher-voltage memories.
  • Documented Speed Grades: Available timing grade (-5E) corresponds to DDR2-400 cycle timing, enabling predictable timing integration in system design.

Why Choose MT47H32M8BP-5E:B?

The MT47H32M8BP-5E:B delivers a compact, standards-based DDR2 SDRAM option with clearly defined timing grades, on-die signal integrity features and low-voltage operation suitable for commercial-temperature embedded designs. Its 32M × 8 organization and 60-FBGA packaging make it straightforward to integrate into space-constrained memory subsystems.

This device is appropriate for designers seeking a documented DDR2-400 memory component with programmable latency, selectable burst modes and ODT for improved timing and signal integrity control. The combination of package size, supply voltage range and JEDEC I/O compatibility supports scalable integration into existing DDR2-capable platforms.

Request a quote or contact sales to discuss availability, lead times and to obtain ordering information for the MT47H32M8BP-5E:B. Reference the full product datasheet for detailed timing, electrical and mechanical specifications.

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