MT47H64M8B6-5E IT:D TR
| Part Description |
IC DRAM 512MBIT PARALLEL 60FBGA |
|---|---|
| Quantity | 504 Available (as of May 5, 2026) |
| Product Category | Memory |
|---|---|
| Manufacturer | Micron Technology Inc. |
| Manufacturing Status | Obsolete |
| Manufacturer Standard Lead Time | RFQ |
| Datasheet |
Specifications & Environmental
| Device Package | 60-FBGA | Memory Format | DRAM | Technology | SDRAM - DDR2 | ||
|---|---|---|---|---|---|---|---|
| Memory Size | 512 Mbit | Access Time | 600 ps | Grade | Automotive | ||
| Clock Frequency | 200 MHz | Voltage | 1.7V ~ 1.9V | Memory Type | Volatile | ||
| Operating Temperature | -40°C ~ 95°C (TC) | Write Cycle Time Word Page | 15 ns | Packaging | 60-FBGA | ||
| Mounting Method | Volatile | Memory Interface | Parallel | Memory Organization | 64M x 8 | ||
| Moisture Sensitivity Level | 3 (168 Hours) | RoHS Compliance | ROHS3 Compliant | REACH Compliance | REACH Unaffected | ||
| Qualification | N/A | ECCN | EAR99 | HTS Code | 8542.32.0024 |
Overview of MT47H64M8B6-5E IT:D TR – IC DRAM 512MBIT PARALLEL 60FBGA
The MT47H64M8B6-5E IT:D TR is a 512 Mbit DDR2 SDRAM device organized as 64M × 8 with a parallel memory interface in a 60-ball FBGA package. It implements DDR2 architecture with features such as a 4n-bit prefetch and four internal banks to support concurrent memory operations.
Designed for applications requiring 1.8 V-class low-voltage operation and extended temperature operation, this industrial-temperature option provides deterministic timing and memory capacity for embedded and industrial designs.
Key Features
- Core & architecture DDR2 SDRAM with 4n-bit prefetch architecture and four internal banks for concurrent operation, supporting programmable CAS latency and posted additive CAS latency.
- Memory capacity & organization 512 Mbit total capacity organized as 64M × 8 (16 Meg × 8 × 4 banks), delivering a compact memory footprint for mid-density designs.
- Performance & timing Clock frequency listed at 200 MHz with an access time of 600 ps and a write cycle time (word page) of 15 ns; selectable burst lengths of 4 or 8 provide flexibility for sequential data transfers.
- Power & I/O Low-voltage operation with VDD = 1.7 V–1.9 V (VDD/VDDQ = +1.8 V ±0.1 V) and JEDEC-standard 1.8 V I/O (SSTL_18-compatible); on-die termination (ODT) and adjustable data-output drive strength improve signal integrity.
- Data integrity & timing control DLL aligns DQ and DQS transitions with the clock; differential data strobe (DQS/DQS#) option and duplicate output strobe (RDQS) option for x8 configurations enhance timing margins.
- Package & temperature 60-ball FBGA package in a footprint suited to compact PCBs; industrial temperature option rated for −40°C to 95°C (T_C).
- Refresh & reliability Standard JEDEC refresh scheme including 8,192-cycle refresh and 64 ms retention refresh interval to maintain data integrity.
- Regulatory status Device is listed as RoHS compliant in the provided product documentation.
Typical Applications
- Industrial control systems The industrial temperature rating (−40°C to 95°C) and compact FBGA package suit embedded controllers and factory automation modules that require reliable mid-density DRAM.
- Embedded computing modules 512 Mbit DDR2 density and parallel interface provide straightforward memory expansion for single-board computers and system-on-module designs.
- Networking and communications equipment Programmable latencies, on-die termination, and selectable burst lengths support buffering and packet processing in network hardware.
- Consumer and portable electronics Low-voltage 1.8 V operation and compact package enable integration into space-constrained devices where DDR2 memory is specified.
Unique Advantages
- Industrial temperature capability Rated for −40°C to 95°C (T_C) for designs that require extended temperature operation.
- Low-voltage operation VDD/VDDQ at approximately 1.8 V (1.7 V–1.9 V) reduces power budget compared with higher-voltage memories while maintaining JEDEC 1.8 V I/O compatibility.
- Flexible timing configuration Programmable CAS latency, posted additive latency, and selectable burst lengths allow tuning for system throughput and latency requirements.
- Signal integrity features On-die termination, DLL alignment of DQ/DQS, and differential DQS options improve timing margins on high-speed interfaces.
- Compact, board-friendly package 60-ball FBGA delivers a small footprint for space-constrained PCB layouts while providing reliable solder-ball termination.
- Designed for concurrent access Four internal banks support interleaved access patterns to improve effective memory throughput in multi-stream workloads.
Why Choose MT47H64M8B6-5E IT:D TR?
The MT47H64M8B6-5E IT:D TR provides a balanced 512 Mbit DDR2 solution with industrial temperature support, low-voltage 1.8 V operation, and packaging suitable for compact embedded designs. Its combination of programmable timing, on-die termination, and banked architecture offers designers predictable latency and flexible throughput tuning.
This device is well suited to engineers specifying mid-density DRAM for embedded computing, industrial controllers, and communications equipment that require deterministic timing, a small board footprint, and extended temperature operation. The specified electrical and timing parameters enable integration into systems where DDR2 behavior and JEDEC 1.8 V I/O compatibility are required.
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