MT47H64M8B6-5E IT:D TR

IC DRAM 512MBIT PARALLEL 60FBGA
Part Description

IC DRAM 512MBIT PARALLEL 60FBGA

Quantity 504 Available (as of May 5, 2026)
Product CategoryMemory
ManufacturerMicron Technology Inc.
Manufacturing StatusObsolete
Manufacturer Standard Lead TimeRFQ
Datasheet

Specifications & Environmental

Device Package60-FBGAMemory FormatDRAMTechnologySDRAM - DDR2
Memory Size512 MbitAccess Time600 psGradeAutomotive
Clock Frequency200 MHzVoltage1.7V ~ 1.9VMemory TypeVolatile
Operating Temperature-40°C ~ 95°C (TC)Write Cycle Time Word Page15 nsPackaging60-FBGA
Mounting MethodVolatileMemory InterfaceParallelMemory Organization64M x 8
Moisture Sensitivity Level3 (168 Hours)RoHS ComplianceROHS3 CompliantREACH ComplianceREACH Unaffected
QualificationN/AECCNEAR99HTS Code8542.32.0024

Overview of MT47H64M8B6-5E IT:D TR – IC DRAM 512MBIT PARALLEL 60FBGA

The MT47H64M8B6-5E IT:D TR is a 512 Mbit DDR2 SDRAM device organized as 64M × 8 with a parallel memory interface in a 60-ball FBGA package. It implements DDR2 architecture with features such as a 4n-bit prefetch and four internal banks to support concurrent memory operations.

Designed for applications requiring 1.8 V-class low-voltage operation and extended temperature operation, this industrial-temperature option provides deterministic timing and memory capacity for embedded and industrial designs.

Key Features

  • Core & architecture  DDR2 SDRAM with 4n-bit prefetch architecture and four internal banks for concurrent operation, supporting programmable CAS latency and posted additive CAS latency.
  • Memory capacity & organization  512 Mbit total capacity organized as 64M × 8 (16 Meg × 8 × 4 banks), delivering a compact memory footprint for mid-density designs.
  • Performance & timing  Clock frequency listed at 200 MHz with an access time of 600 ps and a write cycle time (word page) of 15 ns; selectable burst lengths of 4 or 8 provide flexibility for sequential data transfers.
  • Power & I/O  Low-voltage operation with VDD = 1.7 V–1.9 V (VDD/VDDQ = +1.8 V ±0.1 V) and JEDEC-standard 1.8 V I/O (SSTL_18-compatible); on-die termination (ODT) and adjustable data-output drive strength improve signal integrity.
  • Data integrity & timing control  DLL aligns DQ and DQS transitions with the clock; differential data strobe (DQS/DQS#) option and duplicate output strobe (RDQS) option for x8 configurations enhance timing margins.
  • Package & temperature  60-ball FBGA package in a footprint suited to compact PCBs; industrial temperature option rated for −40°C to 95°C (T_C).
  • Refresh & reliability  Standard JEDEC refresh scheme including 8,192-cycle refresh and 64 ms retention refresh interval to maintain data integrity.
  • Regulatory status  Device is listed as RoHS compliant in the provided product documentation.

Typical Applications

  • Industrial control systems  The industrial temperature rating (−40°C to 95°C) and compact FBGA package suit embedded controllers and factory automation modules that require reliable mid-density DRAM.
  • Embedded computing modules  512 Mbit DDR2 density and parallel interface provide straightforward memory expansion for single-board computers and system-on-module designs.
  • Networking and communications equipment  Programmable latencies, on-die termination, and selectable burst lengths support buffering and packet processing in network hardware.
  • Consumer and portable electronics  Low-voltage 1.8 V operation and compact package enable integration into space-constrained devices where DDR2 memory is specified.

Unique Advantages

  • Industrial temperature capability  Rated for −40°C to 95°C (T_C) for designs that require extended temperature operation.
  • Low-voltage operation  VDD/VDDQ at approximately 1.8 V (1.7 V–1.9 V) reduces power budget compared with higher-voltage memories while maintaining JEDEC 1.8 V I/O compatibility.
  • Flexible timing configuration  Programmable CAS latency, posted additive latency, and selectable burst lengths allow tuning for system throughput and latency requirements.
  • Signal integrity features  On-die termination, DLL alignment of DQ/DQS, and differential DQS options improve timing margins on high-speed interfaces.
  • Compact, board-friendly package  60-ball FBGA delivers a small footprint for space-constrained PCB layouts while providing reliable solder-ball termination.
  • Designed for concurrent access  Four internal banks support interleaved access patterns to improve effective memory throughput in multi-stream workloads.

Why Choose MT47H64M8B6-5E IT:D TR?

The MT47H64M8B6-5E IT:D TR provides a balanced 512 Mbit DDR2 solution with industrial temperature support, low-voltage 1.8 V operation, and packaging suitable for compact embedded designs. Its combination of programmable timing, on-die termination, and banked architecture offers designers predictable latency and flexible throughput tuning.

This device is well suited to engineers specifying mid-density DRAM for embedded computing, industrial controllers, and communications equipment that require deterministic timing, a small board footprint, and extended temperature operation. The specified electrical and timing parameters enable integration into systems where DDR2 behavior and JEDEC 1.8 V I/O compatibility are required.

Request a quote or submit a quotation request to the sales team to discuss availability, pricing, and lead times for the MT47H64M8B6-5E IT:D TR.

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