MT47H64M8CB-3:B TR
| Part Description |
IC DRAM 512MBIT PARALLEL 60FBGA |
|---|---|
| Quantity | 783 Available (as of May 5, 2026) |
| Product Category | Memory |
|---|---|
| Manufacturer | Micron Technology Inc. |
| Manufacturing Status | Obsolete |
| Manufacturer Standard Lead Time | RFQ |
| Datasheet |
Specifications & Environmental
| Device Package | 60-FBGA | Memory Format | DRAM | Technology | SDRAM - DDR2 | ||
|---|---|---|---|---|---|---|---|
| Memory Size | 512 Mbit | Access Time | 450 ps | Grade | Commercial (Extended) | ||
| Clock Frequency | 333 MHz | Voltage | 1.7V ~ 1.9V | Memory Type | Volatile | ||
| Operating Temperature | 0°C ~ 85°C (TC) | Write Cycle Time Word Page | 15 ns | Packaging | 60-FBGA | ||
| Mounting Method | Volatile | Memory Interface | Parallel | Memory Organization | 64M x 8 | ||
| Moisture Sensitivity Level | 5 (48 Hours) | RoHS Compliance | ROHS3 Compliant | REACH Compliance | REACH Unaffected | ||
| Qualification | N/A | ECCN | EAR99 | HTS Code | 8542.32.0024 |
Overview of MT47H64M8CB-3:B TR – IC DRAM 512MBIT PARALLEL 60FBGA
The MT47H64M8CB-3:B TR is a 512 Mbit DDR2 SDRAM organized as 64M × 8 with a parallel memory interface in a 60-ball FBGA package. It implements DDR2 architecture with a 4n-bit prefetch and supports programmable CAS latency and selectable burst lengths.
This device targets designs that require a compact parallel DDR2 memory element operating from a 1.7 V to 1.9 V supply and supporting commercial operating temperatures (0 °C to 85 °C). Key value propositions include JEDEC-standard 1.8 V I/O compatibility, on-die termination, and features that support common DDR2 timing and interface requirements.
Key Features
- Memory Core 512 Mbit DDR2 SDRAM organized as 64M × 8 with 4 internal banks for concurrent operation.
- DDR2 Architecture 4n-bit prefetch architecture with DLL to align DQ and DQS transitions with CK; programmable CAS latency and posted CAS additive latency.
- Interface & Timing Parallel DDR2 interface with JEDEC-standard 1.8 V I/O (SSTL_18-compatible); selectable burst lengths of 4 or 8 and WRITE latency defined relative to READ latency.
- Performance Clock frequency referenced at 333 MHz (device spec), access time ~450 ps and word/page write cycle time of 15 ns.
- Power Vdd and VddQ supply range of 1.7 V to 1.9 V (Vdd = +1.8 V ±0.1 V as per datasheet).
- Signal Integrity On-die termination (ODT) and adjustable data-output drive strength options to assist signal integrity on parallel interfaces.
- Reliability & Refresh Standard 8,192-cycle (8K) refresh with 64 ms refresh interval support.
- Package & Temperature 60-ball FBGA (60-FBGA) mounting in a compact ball grid format; commercial operating temperature 0 °C to 85 °C (TC).
Typical Applications
- Parallel DDR2 Memory Subsystems Provides 512 Mbit DDR2 in a 60-FBGA footprint for systems that require a parallel SDRAM interface and JEDEC-standard 1.8 V I/O.
- Embedded Systems Used where a compact, volatile DDR2 memory element is required at commercial operating temperatures (0 °C to 85 °C).
- Legacy DDR2 Designs Suitable for designs that implement DDR2 timing profiles including programmable CAS latency and selectable burst lengths.
Unique Advantages
- JEDEC-standard 1.8 V I/O: Ensures compatibility with SSTL_18-compatible systems using a 1.7 V–1.9 V supply range.
- Compact FBGA Package: 60-ball FBGA provides a space-efficient mounting option for board-level integration.
- Flexible Timing: Programmable CAS latency, additive latency, and selectable burst lengths (4 or 8) enable timing optimization for various DDR2 data rates.
- Signal and Drive Options: On-die termination and adjustable data-output drive strength support improved signal integrity on parallel buses.
- Refresh and Bank Architecture: 4 internal banks plus standard 8K refresh support concurrent operation and standard refresh management.
Why Choose IC DRAM 512MBIT PARALLEL 60FBGA?
The MT47H64M8CB-3:B TR positions itself as a straightforward 512 Mbit DDR2 SDRAM option for designs needing a parallel DDR2 memory device in a 60-FBGA package. Its JEDEC-standard 1.8 V I/O, on-die termination, and programmable timing features provide a clear match for systems that rely on standard DDR2 signaling and timing.
This device is well suited to engineers and procurement teams specifying commercial-temperature DDR2 memory with defined electrical and timing characteristics (1.7 V–1.9 V supply, 333 MHz reference clock frequency, 64M × 8 organization). It delivers predictable DDR2 behavior and compact packaging for integration into space-constrained, parallel-memory architectures.
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