MT53E1G32D2FW-046 IT:A TR
| Part Description |
IC DRAM 32GBIT PAR 200TFBGA |
|---|---|
| Quantity | 1,197 Available (as of May 5, 2026) |
| Product Category | Memory |
|---|---|
| Manufacturer | Micron Technology Inc. |
| Manufacturing Status | Obsolete |
| Manufacturer Standard Lead Time | RFQ |
| Datasheet |
Specifications & Environmental
| Device Package | 200-TFBGA (10x14.5) | Memory Format | DRAM | Technology | SDRAM - Mobile LPDDR4X | ||
|---|---|---|---|---|---|---|---|
| Memory Size | 32 Gbit | Access Time | N/A | Grade | Automotive | ||
| Clock Frequency | 2.133 GHz | Voltage | 1.06V ~ 1.17V | Memory Type | Volatile | ||
| Operating Temperature | -40°C ~ 95°C (TC) | Write Cycle Time Word Page | 18 ns | Packaging | 200-TFBGA | ||
| Mounting Method | Volatile | Memory Interface | Parallel | Memory Organization | 1G x 32 | ||
| Moisture Sensitivity Level | N/A | RoHS Compliance | Unknown | REACH Compliance | REACH Unaffected | ||
| Qualification | N/A | ECCN | N/A | HTS Code | N/A |
Overview of MT53E1G32D2FW-046 IT:A TR – 32 Gbit Mobile LPDDR4X SDRAM, Parallel Interface
The MT53E1G32D2FW-046 IT:A TR is a 32 Gbit volatile DRAM device implemented in Mobile LPDDR4X SDRAM technology with a parallel memory interface. It is organized as 1G × 32 and targets applications that require high data rate memory in a compact BGA package.
Key attributes include a 2.133 GHz clock frequency, low-voltage operation across 1.06 V to 1.17 V, and a 200-TFBGA (10 × 14.5 mm) package footprint, offering a balance of density, speed, and space-efficient integration for mobile and high-bandwidth designs.
Key Features
- Core Memory Technology Mobile LPDDR4X SDRAM implementation providing volatile DRAM storage with a 32 Gbit capacity.
- Memory Organization & Interface Organized as 1G × 32 with a parallel memory interface suited to parallel DRAM topologies.
- High-Speed Operation Supports a clock frequency of 2.133 GHz for high-throughput data transfer.
- Low-Voltage Power Operates from 1.06 V to 1.17 V, enabling lower-power memory operation consistent with mobile LPDDR4X technology.
- Timing Write cycle time (word page) specified at 18 ns for deterministic write performance.
- Package and Footprint Supplied in a 200-TFBGA package with dimensions 10 × 14.5 mm for compact board-level integration.
- Operating Temperature Range Rated for −40°C to 95°C (TC) to cover a broad thermal envelope for deployed electronics.
Typical Applications
- Mobile Devices Memory subsystem use in mobile-class devices where Mobile LPDDR4X technology and low-voltage operation are required.
- High-Bandwidth Memory Subsystems Parallel interface and 2.133 GHz clocking address applications that require higher data throughput.
- Space-Constrained PCB Designs The 200-TFBGA (10 × 14.5 mm) package suits compact board layouts where package footprint is a consideration.
Unique Advantages
- High density in a compact package: 32 Gbit capacity in a 200-TFBGA (10 × 14.5 mm) footprint simplifies high-density memory integration.
- High-clock performance: 2.133 GHz clock frequency supports elevated data throughput for demanding memory operations.
- Low-voltage operation: 1.06 V to 1.17 V supply range reduces power draw compared with higher-voltage memory options.
- Deterministic write timing: 18 ns write cycle time (word page) provides a defined timing characteristic for system design.
- Wide operating temperature: −40°C to 95°C rating enables deployment across a broad thermal range.
- Parallel interface: Parallel memory interface supports integration into parallel DRAM architectures.
Why Choose MT53E1G32D2FW-046 IT:A TR?
The MT53E1G32D2FW-046 IT:A TR from Micron Technology Inc. positions itself as a high-density, low-voltage Mobile LPDDR4X DRAM option suited to designs that require compact, high-bandwidth memory. Its 1G × 32 organization, 2.133 GHz clocking, and defined write timing make it applicable for systems where throughput and predictable timing are key design considerations.
This device is appropriate for customers needing a space-efficient 32 Gbit DRAM solution with broad operating temperature support and a parallel interface. The combination of capacity, package size, voltage range, and timing characteristics supports scalability and integration into mobile and high-bandwidth memory subsystems.
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