MT53E512M64D4HJ-046 AAT:D TR

IC DRAM 32GBIT PAR 556WFBGA
Part Description

IC DRAM 32GBIT PAR 556WFBGA

Quantity 277 Available (as of May 5, 2026)
Product CategoryMemory
ManufacturerMicron Technology Inc.
Manufacturing StatusObsolete
Manufacturer Standard Lead TimeRFQ
Datasheet

Specifications & Environmental

Device Package556-WFBGA (12.4x12.4)Memory FormatDRAMTechnologySDRAM - Mobile LPDDR4
Memory Size32 GbitAccess TimeN/AGradeN/A
Clock FrequencyN/AVoltageN/AMemory TypeN/A
Operating TemperatureN/AWrite Cycle Time Word PageN/APackaging556-TFBGA
Mounting MethodN/AMemory InterfaceParallelMemory Organization512M x 64
Moisture Sensitivity LevelN/ARoHS ComplianceN/AREACH ComplianceREACH Unaffected
QualificationN/AECCNN/AHTS CodeN/A

Overview of MT53E512M64D4HJ-046 AAT:D TR – IC DRAM 32GBIT PAR 556WFBGA

The MT53E512M64D4HJ-046 AAT:D TR is a 32 Gbit DRAM device implemented in Mobile LPDDR4/LPDDR4X SDRAM technology. It uses a parallel memory interface with a 512M x 64 organization and is supplied in a 556-ball WFBGA package (12.4 × 12.4 mm).

This device targets designs that require high-density, high-bandwidth mobile LPDDR4 memory with low-voltage supply options and integrated device-level features for memory management and power efficiency.

Key Features

  • Technology / Architecture  Mobile LPDDR4/LPDDR4X SDRAM architecture with 16n prefetch and 8 internal banks per channel for concurrent operation.
  • Memory Organization & Capacity  512M × 64 organization delivering 32 Gbit total memory capacity in a multi-die package option.
  • Performance  Speed grade -046 supports a 2133 MHz clock rate and 4266 Mb/s data rate per pin (data rate per pin shown in datasheet).
  • Low-Voltage Supply Options  Datasheet lists nominal supply ranges including VDD1 = 1.70–1.95 V (1.80 V nominal), VDD2 = 1.06–1.17 V (1.10 V nominal), and VDDQ options of 0.57–0.65 V (0.60 V nominal) or 1.06–1.17 V (1.10 V nominal).
  • Latency & Burst Control  Programmable READ and WRITE latencies (RL/WL) and selectable burst lengths (BL = 16, 32) to tune performance for system requirements.
  • Refresh & Reliability Features  Directed per-bank refresh for concurrent bank operation, partial-array self refresh (PASR), and an on-chip temperature sensor to manage self-refresh behavior.
  • I/O & Termination  Bidirectional/differential data strobe per byte lane, selectable output drive strength (DS), programmable VSS (ODT) termination, and single-data-rate CMD/ADR entry.
  • Package  556-ball TFBGA/WFBGA package option (12.4 × 12.4 mm) suitable for high-density mounting; package marking option HJ corresponds to this 556-ball package.
  • Additional System Features  Support for clock-stop capability and single-ended CK and DQS support as documented in the datasheet.

Typical Applications

  • Mobile devices  Mobile LPDDR4/LPDDR4X architecture is intended for handheld and mobile memory subsystems that require high density and low-voltage operation.
  • High-bandwidth memory subsystems  High per-pin data rate (4266 Mb/s) and multi-bank architecture support bandwidth-intensive tasks such as multimedia and graphics buffering.
  • Low-voltage embedded designs  Multiple low-voltage supply options and power-management features make it suitable for embedded systems that prioritize power efficiency.

Unique Advantages

  • High-density in a compact package: 32 Gbit memory capacity implemented in a 556-ball WFBGA (12.4 × 12.4 mm) package for space-constrained systems.
  • High per-pin throughput: Speed grade -046 provides a 2133 MHz clock and 4266 Mb/s per-pin data rate to meet demanding bandwidth requirements.
  • Flexible voltage options: Multiple VDD1/VDD2/VDDQ ranges documented for LPDDR4X/LPDDR4 to match system power domains and efficiency targets.
  • Software-tunable performance: Programmable RL/WL and burst-length options allow system designers to optimize latency and throughput trade-offs.
  • System-level power management: Directed per-bank refresh, PASR and an on-chip temperature sensor help reduce active and standby power while maintaining data integrity.
  • Integrated I/O control: Selectable output drive strength and programmable ODT provide signal integrity and termination flexibility for high-speed interfaces.

Why Choose IC DRAM 32GBIT PAR 556WFBGA?

The MT53E512M64D4HJ-046 AAT:D TR combines high density, mobile LPDDR4/LPDDR4X architecture and high per-pin data rates in a compact 556-ball WFBGA package, making it well suited for designs that require substantial memory capacity and bandwidth within a small footprint. Its programmable latency, burst control and power-management features allow designers to tune performance and power consumption to application needs.

This Micron DRAM device is appropriate for customers building mobile and embedded systems that require low-voltage operation, high throughput and integrated device-level features for refresh and thermal management. The documented voltage ranges, speed grade and package information support informed system integration and long-term design planning.

Request a quote or submit a product inquiry to confirm availability, lead times and pricing for this MT53E512M64D4HJ-046 AAT:D TR memory device.

Request a Quote

















    No file selected



    Our team will respond within 24 hours.


    I agree to receive newsletters and promotional emails. I can unsubscribe at any time.

    Certifications and Membership
    NQA AS9100 CMYK ANAB
    NQA AS9100 ANAB Badge
    ESD2020 Badge
    ESD2020 Association Badge
    GIDEP Badge
    GIDEP Badge
    Suntsu ERAI MemberVerification
    Suntsu ERAI Member Verification
    Available Shipping Methods
    FedEx
    UPS
    DHL
    Accepted Payment Methods
    American Express
    American Express
    Discover
    Discover
    MasterCard
    MasterCard
    Visa
    Visa
    UnionPay
    UnionPay
    Featured Products
    Latest News
    keyboard_arrow_up