NAND512W3A2CN6E

IC FLASH 512MBIT PARALLEL 48TSOP
Part Description

IC FLASH 512MBIT PARALLEL 48TSOP

Quantity 1,645 Available (as of May 5, 2026)
Product CategoryMemory
ManufacturerMicron Technology Inc.
Manufacturing StatusObsolete
Manufacturer Standard Lead TimeRFQ
Datasheet

Specifications & Environmental

Device Package48-TSOPMemory FormatFLASHTechnologyFLASH - NAND
Memory Size512 MbitAccess Time50 nsGradeIndustrial
Clock FrequencyN/AVoltage2.7V ~ 3.6VMemory TypeNon-Volatile
Operating Temperature-40°C ~ 85°C (TA)Write Cycle Time Word Page50 nsPackaging48-TFSOP (0.724", 18.40mm Width)
Mounting MethodNon-VolatileMemory InterfaceParallelMemory Organization64M x 8
Moisture Sensitivity Level3 (168 Hours)RoHS ComplianceROHS CompliantREACH ComplianceREACH Unaffected
QualificationN/AECCN3A991B1AHTS Code8542.32.0071

Overview of NAND512W3A2CN6E – IC FLASH 512MBIT PARALLEL 48TSOP

The NAND512W3A2CN6E is a 512 Mbit parallel NAND flash memory device in a 48-TSOP package. It implements SLC NAND flash architecture with a parallel NAND interface and is targeted at high-density mass storage and embedded memory applications.

Designed for integration where non-volatile, board-mounted storage is required, the device combines page-based organization, fast access characteristics, and industry-standard signaling for streamlined system integration.

Key Features

  • Memory Capacity & Organization — 512 Mbit total capacity organized as 64M x 8 with a page architecture of 528-byte / 264-word pages (x8/x16 distinction noted in datasheet).
  • Parallel NAND Interface — Standard NAND interface with x8 bus width, multiplexed address/data lines and support for common NAND command and control signals for direct host/controller interfacing.
  • Performance — Access time specified at 50 ns; datasheet lists random and sequential read characteristics and a typical page program time of 200 μs and typical fast block erase time of 2 ms.
  • Write/Read Timing — Write cycle time (word/page) listed at 50 ns; datasheet provides random access (12 μs @ 3 V / 15 μs @ 1.8 V) and sequential access timing values.
  • Power — Supply voltage range 2.7 V to 3.6 V (3 V class operation noted in supporting datasheet material).
  • Endurance & Data Retention — Datasheet documents program/erase endurance up to 100,000 cycles (with ECC) and data retention specified at 10 years.
  • Reliability & Data Management — Built-in features and supporting documentation include status register, electronic signature, security/OTP area, bad block management, wear-leveling guidance and ECC models.
  • Package & Temperature — 48-TFSOP / 48-TSOP package (0.724", 18.40 mm width) with an operating ambient temperature range of -40 °C to 85 °C.

Typical Applications

  • Mass Storage Modules — High-density NAND array and page/block architecture make the device suitable for embedded mass storage implementations where board-mounted flash is required.
  • Embedded Systems — Parallel interface and standard NAND command set simplify integration into controllers and embedded platforms that require non-volatile program or data storage.
  • Consumer & Industrial Electronics — The 512 Mbit capacity and extended operating temperature range support a range of consumer and industrial storage applications that use on-board flash memory.

Unique Advantages

  • High-density storage in a compact package: 512 Mbit capacity delivered in a 48-TSOP footprint (0.724", 18.40 mm), enabling significant on-board storage without large board area impact.
  • Parallel NAND interface for direct integration: x8 bus width and multiplexed address/data lines provide compatibility with standard NAND controllers and simplify host interfacing.
  • Documented performance and timing: Specified access time (50 ns) and datasheet timing metrics for read, program and erase operations support predictable system-level performance planning.
  • Endurance and retention characterized: Datasheet guidance lists program/erase endurance (100,000 cycles with ECC) and 10-year data retention for long-term storage planning.
  • Designed for robustness: Extended operating temperature range of -40 °C to 85 °C and supporting features such as status register, hardware data protection and bad block management contribute to system reliability.

Why Choose NAND512W3A2CN6E?

The NAND512W3A2CN6E positions itself as a high-density SLC NAND flash option for designs that require reliable, board-mounted non-volatile storage with a standard parallel NAND interface. Its documented timing, endurance figures, and support features (status register, OTP, bad block management) make it suitable for embedded and storage-focused designs that need predictable behavior and long-term data retention.

This device is appropriate for engineering teams seeking a compact 48-TSOP packaged NAND solution with clear datasheet guidance on array organization, program/erase characteristics and integration considerations.

Request a quote or submit an inquiry to receive pricing, availability and further technical information for the NAND512W3A2CN6E.

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