EPF6016AQC208-1N

The EPF6016AQC208-1N is a FLEX 6000 series programmable logic device from Intel, providing reconfigurable logic in a 208-pin BFQFP (28 × 28) package. Based on the OptiFLEX architecture and a register-rich, look-up table (LUT) design, this device targets low-cost alternatives to high-volume gate-array designs and rapid prototyping or design testing.

Key device attributes include 1,320 logic elements (approximately 16,000 typical gates), 171 user I/O pins, support for in-circuit reconfigurability, RoHS compliance, a 3.0–3.6 V supply range, and a commercial operating temperature range of 0 °C to 85 °C.

Key Features

• Core Architecture OptiFLEX architecture with a register-rich, LUT-based core delivering 1,320 logic elements and a typical gate-equivalent of 16,000 for medium-density logic integration.
• I/O and Interfaces 171 programmable I/O pins with individual tri-state output enable control and programmable output slew-rate control to manage switching noise and interface timing.
• Clocking and Timing Built-in low-skew clock distribution tree and four low-skew global paths suitable for clock, clear, preset, or critical logic signals.
• Interconnect and Arithmetic Support FastTrack interconnect continuous routing structure plus dedicated carry and cascade chains to implement fast adders, counters, and high-fan-in logic functions.
• Reconfigurability and Testability In-circuit reconfigurability (ICR) via external configuration device or intelligent controller and built-in JTAG boundary-scan test circuitry compliant with IEEE Std. 1149.1.
• Packaging and Supply 208-pin BFQFP (supplier package: 208-PQFP 28×28) surface-mount package; supply voltage range 3.0 V to 3.6 V; commercial grade operation from 0 °C to 85 °C.
• Quality and Compliance Devices are 100% functionally tested prior to shipment and listed as RoHS compliant.
• Memory Total on-chip RAM: 0 bits (no embedded RAM reported for this device).

Typical Applications

• Prototyping & Design Verification Rapid iteration of hardware logic and functional testing during development, leveraging in-circuit reconfigurability to update designs without board changes.
• Low- to Mid-Volume Gate-Array Replacement Cost-effective alternative for replacing high-volume gate-array designs where reprogrammability and faster time-to-market are required.
• Multi-Voltage System Bridging I/O capabilities allow interfacing between subsystems operating at different voltages, supporting mixed-voltage board designs.
• Systems Requiring Boundary-Scan Test Built-in IEEE 1149.1 JTAG boundary-scan facilitates board-level testing and diagnostics without consuming additional device logic.

Unique Advantages

• Area-efficient OptiFLEX Architecture: Optimized die utilization balances performance and density for medium-complexity logic implementations.
• Flexible I/O Control: Per-pin tri-state enable and programmable slew-rate reduce the need for external buffering and simplify signal integrity management.
• Dedicated Arithmetic Paths: Built-in carry and cascade chains accelerate implementation of adders, counters, and other arithmetic functions through automatic tool support.
• In-circuit Reconfiguration: Update or modify designs in the field via external configuration devices or controllers, shortening development cycles and enabling post-deployment changes.
• Proven Testability: 100% functional testing and integrated JTAG boundary-scan support simplify board bring-up and production test strategies.
• Package Options for Dense I/O: The 208-pin BFQFP (208-PQFP 28×28) provides a compact surface-mount footprint with 171 available I/O pins for signal-dense applications.

Why Choose EPF6016AQC208-1N?

The EPF6016AQC208-1N offers a balanced, reprogrammable logic solution for engineers needing medium-density logic (1,320 logic elements) with substantial I/O (171 pins) in a compact 208-BFQFP package. Its OptiFLEX architecture, dedicated arithmetic chains, and low-skew clock distribution make it suitable for designs that require predictable routing and in-field flexibility.

With 100% functional testing, built-in JTAG boundary-scan, RoHS compliance, and a commercial operating range, this device is positioned for development, prototyping, and low- to mid-volume deployments where reconfigurability and rapid design iteration are priorities.

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